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Photogeneration of coherent shear phonons in orientated wurtzite semiconductors by piezoelectric coupling
(2009-11-01)
Wen, Yu-Chieh
;
Ko, Tsung-Shine
;
Lu, Tien-Chang
;
Kuo, Hao-Chung
;
Chyi, Jen-Inn
Using piezoelectric wurtzite semiconductor with accurate control of the crystal cut, we investigate the photogeneration of coherent shear acoustic phonons through anisotropic piezoelectric coupling. Theoretical study suggests the dominant contribution of the piezoelectric effect to the shear phonon generation in a-plane wurtzite GaN, which is also confirmed by the picosecond ultrasonic experiments with different dopant and excitation conditions. Piezoelectric transduction thus explains the observed remarkable coherent shear phonon signal. The influence of the ultrafast screening of surface electric field by photocarriers on the intensity and waveform of the generated shear acoustic pulse are discussed.
Enhancing the Emission Efficiency of In0.2Ga0.8N/GaN MQW Blue LED by Using Appropriately Misoriented Sapphire Substrates
(2009-01-01)
Li, Zhen-Yu
;
Uen, Wu-Yih
;
Lo, Ming-Hua
;
Chiu, Ching-Hua
;
Lin, Po-Chun
In this paper, we report the fabrication of an In0.2Ga0.8N/GaN multiple-quantum-well (MQW) structure on vicinal sapphire substrates with a very small offset angle of 0-1 degrees by low-pressure metallorganic chemical vapor deposition. Our study demonstrates that the quality of the In0.2Ga0.8N/GaN MQW structure is very sensitive to the offset angle of the vicinal substrate. High-resolution X-ray diffraction analyses demonstrated high-order satellite peaks and clear fringes between them for all MQW structures fabricated, from which the interface roughness (IRN) was estimated. The IRN of the In0.2Ga0.8N/GaN MQW structure fabricated on 0.2 degrees off sapphire substrate was determined as 1.36% of the quantum well layer period. Besides, reciprocal lattice mapping was employed to examine the strain status of the MQW. The lattice relaxation of the same specimen mentioned above was estimated to be 7.4x10(-5). It is therefore manifested that an In0.2Ga0.8N/GaN MQW structure with abrupt interfaces and good layer periodicity was grown. From it, a shortest radiative lifetime of 14.2 ns and a lowest fluctuation of 5.6 meV in the emission energy of micro-photoluminescence mapping were achieved. In addition, superior material qualities of the whole film fabricated on 0.2 degrees off substrate were recognized by cross-sectional transmission electron microscopy. Based on the results mentioned above, a high-quality In0.2Ga0.8N/GaN MQW blue light, emitting diode (LED) has been fabricated on 0.2 degrees off substrate, which demonstrated a strong room-temperature electroluminescence emission at the wavelength of 465 nm and with the full width at half maximum of only 19 nm. The same device also showed an output power of 13.4 mW and an external quantum efficiency of 19.2%. Both these characteristics are improved drastically compared with the devices fabricated on the substrates with other offset angles. Conclusively, the use of an appropriately misoriented sapphire substrate is suggested to be effective for elevating the emission efficiency of In0.2Ga0.8N/GaN MQW blue LED fabricated thereon.
Particular Failure Mechanism of GaN-Based Alternating Current Light-Emitting Diode Induced by GaOx Oxidation
(2010-08-01)
Yen, Hsi-Hsuan
;
Kuo, Hao-Chung
;
Yeh, Wen-Yung
;
光電工程學系
;
光電工程研究所
This investigation describes the unique failure mechanism of the Wheatstone bridge circuit-type alternating current light-emitting diode (WB AC-LED). The micro-LEDs in WB AC-LED rectifying branches were reverse biased, and therefore, positive charges (holes) accumulated in the n-type GaN layer under the active region and combined with the GaN material and OH- ions to generate GaOx oxidation grains. The GaOx generation speed was fast with high reverse voltage applied to micro-LEDs, and the expansion of GaOx dimensions degraded the opto-electrical characteristics and eventually caused failure of the WB AC-LED. The root-mean-square reverse voltage dropped across each micro-LED from -13.1 to -6.7 V with different micro-LEDs array arrangements extended the WB AC-LED life-time from being less than 650 h to more than 1600 h, respectively.
High extraction efficiency GaN-based light-emitting diodes on embedded SiO2 nanorod array and nanoscale patterned sapphire substrate
(2010-06-28)
Huang, Hung-Wen
;
Huang, Jhi-Kai
;
Kuo, Shou-Yi
;
Lee, Kang-Yuan
;
Kuo, Hao-Chung
In this paper, GaN-based LEDs with a nanoscale patterned sapphire substrate (NPSS) and a SiO2 photonic quasicrystal (PQC) structure on an n-GaN layer using nanoimprint lithography are fabricated and investigated. The light output power of LED with a NPSS and a SiO2 PQC structure on an n-GaN layer was 48% greater than that of conventional LED. Strong enhancement in output power is attributed to better epitaxial quality and higher reflectance resulted from NPSS and PQC structures. Transmission electron microscopy images reveal that threading dislocations are blocked or bended in the vicinities of NPSS layer. These results provide promising potential to increase output power for commercial light emitting devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3456385]
Continuous wave operation of current injected GaN vertical cavity surface emitting lasers at room temperature
(2010-08-16)
Lu, Tien-Chang
;
Chen, Shih-Wei
;
Wu, Tzeng-Tsong
;
Tu, Po-Min
;
Chen, Chien-Kang
We report the demonstration of the continuous wave laser action on GaN-based vertical cavity surface emitting lasers at room temperature. The laser structure consists of a ten-pair Ta(2)O(5)/SiO(2) distributed Bragg reflector (DBR), a 7 lambda-thick optical cavity, ten-pairs InGaN/GaN multiquantum wells with an AlGaN electron blocking layer, and a 29-pair AlN/GaN DBR. The laser has a threshold current of about 9.7 mA corresponding to the current density of about 12.4 kA/cm(2) and a turn-on voltage about 4.3 V at 300 K. The lasing wavelength was 412 nm with a linewidth of about 0.5 nm. A spontaneous emission coupling efficiency factor of about 5x10(-3) and the degree of polarization of about 55% were measured, respectively. The laser beam has a narrow divergence angle of about 8 degrees. (C) 2010 American Institute of Physics. [doi:10.1063/1.3483133]
Directional light extraction enhancement from GaN-based film-transferred photonic crystal light-emitting diodes
(2009-03-23)
Lai, Chun-Feng
;
Chao, Chia-Hsin
;
Kuo, Hao-Chung
;
Yen, His-Hsuan
;
Lee, Chia-En
Experimental investigation of the directionality in the far-field pattern and light extraction enhancement in collected cone were performed in GaN-based film-transferred photonic crystal (PhC) light-emitting diodes (FTLEDs). Angular-resolved measurement revealed directional profile and azimuthal anisotropy in the far-field distribution with guided modes extraction. Good agreement according to Bragg's diffraction theory and free photon band structure were achieved. The light enhancement in PhC FTLEDs compared to non-PhC FTLEDs within the collection cone angle was obtained according to measured three-dimensional far-field patterns. In a +/- 20 degrees collection cone, collected light was enhanced by a factor of similar to 2.4 for the collimated PhC FTLED.
High output power density from GaN-based two-dimensional nanorod light-emitting diode arrays
(2009-04-06)
Lee, Ya-Ju
;
Lin, Shawn-Yu
;
Chiu, Ching-Hua
;
Lu, Tien-Chang
;
Kuo, Hao-Chung
Here we propose and realize a scheme for making a direct contact to a two-dimensional nanorod light-emitting diode (LED) array using the oblique-angle deposition approach. And, more importantly, we demonstrate highly efficient electrical carrier injection into the nanorods. As a result, we show that at a 20 mA dc current injection, the light output power density of our nanorod LED array is 3700 mW cm(-2). More general, this contact scheme will pave the ways for making direct contacts to other kinds of nanoscale optoelectronic devices.
Nanorod epitaxial lateral overgrowth of a-plane GaN with low dislocation density
(2009-06-22)
Ling, Shih-Chun
;
Chao, Chu-Li
;
Chen, Jun-Rong
;
Liu, Po-Chun
;
Ko, Tsung-Shine
The crystal quality of a-plane GaN films was improved by using epitaxial lateral overgrowth on a nanorod GaN template. The investigation of x-ray diffraction showed that the strain in a-plane GaN grown on r-plane sapphire could be mitigated. The average threading dislocation density estimated by transmission electron microscopy was reduced from 3x10(10) to 3.5x10(8) cm(-2). From the temperature-dependent photoluminescence, the quantum efficiency of the a-plane GaN was enhanced by the nanorod epitaxial lateral overgrowth (NRELOG). These results demonstrated the opportunity of achieving a-plane GaN films with low dislocation density and high crystal quality via NRELOG.
Low Droop Nonpolar GaN/InGaN Light Emitting Diode Grown on m-Plane GaN Substrate
(2010)
Chang, Shih-Pang
;
Lu, Tien-Chang
;
Zhuo, Li-Fu
;
Jang, Chung-Ying
;
Lin, Da-Wei
The low droop nonpolar m-plane InGaN/GaN light emitting diode (LED) has been fabricated and investigated. The external quantum efficiency for a 300x300 mu m square LED chip only drops about 18% from maximum at an operation current of 22 A/cm(2) (20 mA) to 330 A/cm(2) (300 mA) dc operations at room temperature. In addition, the internal quantum efficiency has been extracted by temperature-dependent photoluminescence measurements, and there is no droop observed as the carrier density increases. The small droop in efficiency of m-plane LEDs could be due to the lack of polarization effects that enhances the carrier confinement under high current density operation. The polarization anisotropy is clearly observed in the m-plane LED, and the degree of polarization is 68%.
Ultraviolet GaN-based microdisk laser with AlN/AlGaN distributed Bragg reflector
(2010-04-12)
Chen, Cheng-Chang
;
Shih, M. H.
;
Yang, Yi-Chun
;
Kuo, Hao-Chung
;
光電工程學系
We demonstrated a 4.7 mu m GaN-based microdisk laser with 25-pair AlN/AlGaN distributed Bragg reflector in ultraviolet range without undercut or deeply-etching procedures. The distributed Bragg reflector provides a high reflectivity of 85%, and selects lasing mode around 375 nm wavelength. Under optical pumping conditions, the lasing action was observed with a low threshold power density of 0.03 kW/cm(2). We also characterized the whispering gallery mode profiles of the microdisk with finite-different time-domain simulation.

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