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學術出版;;Publications

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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作，涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.

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Author: search.filters.author.Liao, Mou-YuanSubject: search.filters.subject.critical value

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    One-sided process capability assessment in the presence of measurement errors
    (2006-11-01)
    Pearn, W. L.
    ;
    Liao, Mou-Yuan
    ;
    工業工程與管理學系
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    Department of Industrial Engineering and Management
    In the manufacturing industry, many product characteristics are of one-sided specifications. The well-known process capability indices C-PU and C-PL are often used to measure process performance. Most capability research works have assumed no measurement errors. Unfortunately, such an assumption is not realistic even if the measurement is conducted using highly sophisticated advanced measuring instruments. Therefore, conclusions drawn regarding process capability are not reliable. In this paper, we consider the estimation and testing of C-PU and C-PL with the presence of measurement errors, to obtain adjusted lower confidence bounds and critical values for true process capability, which can be used to determine whether the factory processes meet the capability requirement when the measurement errors are unavoidable. Copyright (C) 2005 John Wiley & Sons, Ltd.
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    Estimating and testing process precision with presence of gauge measurement errors
    (2007-10-01)
    Pearn, W. L.
    ;
    Liao, Mou-Yuan
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    Process capability indices have been widely used in the manufacturing industry. Those capability indices, quantifying process potential and performance, are important for any successful quality improvement activities and quality program implementation. Because of the simplicity and easy of understanding, the precision index C-p has gained its popularity for measuring process consistency. However, the quality of data on the process characteristics relies very much on the gauge measurement. Conclusions about capability of the process just only based on the single numerical value of the index are not reliable. In this paper, we not only conduct the performance of the index C-p with gauge measurement errors, but also present adjusted confidence interval bounds and critical values for capability testing purpose of C-p with unavoidable measurement errors. Our research would help practitioners to determine whether the factory processes meet the capability requirement, and make more reliable decisions.