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Author: search.filters.author.Lin, Chih-PingSubject: search.filters.subject.dielectric spectroscopy

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    Dielectric Spectroscopy Using Dual Reflection Analysis of TDR Signals
    (2019-03-02)
    Ngui, Yin Jeh
    ;
    Lin, Chih-Ping
    ;
    Wu, Tsai-Jung
    ;
    土木工程學系
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    Department of Civil Engineering
    Time-domain reflectometry (TDR) has been a powerful tool for measuring soil dielectric properties. Initiating from apparent dielectric constant (Ka) measurement up until apparent and complex dielectric spectroscopies, the embedded information in the TDR signal can be extracted to inspire our understanding of the underlying dielectric behaviors. Multiple full waveform inversion techniques have been developed to extract complex dielectric permittivity (CDP) spectrum, but most of them involved prior knowledge of input function and tedious calibration. This rendered the field dielectric spectroscopy challenging and expensive to conduct. Dual reflection analysis (DRA) is proposed in this study to measure CDP spectrum from 10 MHz to 1 GHz. DRA is a simple, robust, model-free, and source-function free algorithm which requires minimal calibration effort. The theoretical framework of DRA is established and the necessary signal processing procedures are elaborated in this study. Eight materials with different dielectric characteristics are selected to evaluate DRA's performance, by using both simulated and experimental signals. DRA is capable of measuring non-dispersive materials very well, whereas dispersive materials require the assistance of a long-time-window (LTW) extraction method to further extend the effective bandwidth. The DRA approach is suitable for field applications that can only record a limited amount of data points and in-situ dielectric spectroscopy.
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    Multiple Reflection Analysis of TDR Signal for Complex Dielectric Spectroscopy
    (2018-11-01)
    Lin, Chih-Ping
    ;
    Ngui, Yin Jeh
    ;
    Lin, Chun-Hung
    ;
    交大名義發表
    ;
    National Chiao Tung University
    Most dielectric spectroscopy techniques require careful system calibration, tedious measurement, specially designed probes, precise input source, and some even involved complicated inversion models. This paper proposed a rapid, robust, and model-free multiple reflection analysis (MRA) of time-domain reflectometry (TDR) signals to measure the complex dielectric permittivity (CDP) spectrum. The key to MRA approach is to decompose the first top reflection and the subsequent multiple reflections from TDR signal and to compare their spectral ratio (MRA ratio). This ratio was theoretically derived from the transmission line theory and found to be independent of source function and impedance mismatches in the leading sections. Based on this theoretical formulation, the CDP spectrum can be uniquely inverted from the measured MRA ratio through optimization and an iterated initial guess method. Numerical evaluations and experimental verifications had proven that MRA is a reliable algorithm for measuring CDP spectrum covering 10 MHz-I CHz. Factors influencing the reliable frequency region were discussed and recommendations on enhancing CDP measurement was proposed for highly dispersive materials. The MRA approach enables dielectric spectroscopy to be conveniently conducted in both laboratory and field, without complicated system setup and calibration.
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    A novel TDR signal processing technique for measuring apparent dielectric spectrum
    (2017-01)
    Lin, Chih-Ping
    ;
    Ngui, Yin Jeh
    ;
    Lin, Chun-Hung
    ;
    交大名義發表
    ;
    National Chiao Tung University
    Conventional time-domain reflectometry (TDR) signal interpretation generated single-valued apparent dielectric constant, while sophisticated, inconvenient measurement system and analysis is needed for measuring spectral complex dielectric permittivity (CDP). Niching between these approaches, a novel phase velocity analysis (PVA) method is developed to efficiently measure apparent dielectric spectrum (ADS) directly from TDR signals in a simple, quick, model-free, and inversion-free manner. The proposed PVA method extracts the two reflections from the top and end of the sensing probe by proper window selection and calculates their phase shift at each frequency, from which the phase velocity and corresponding apparent dielectric constant can be determined. Numerical and experimental results demonstrated that PVA is capable of measuring ADS in a frequency band, typically from 100 MHz-1 GHz. The effect of signal truncation was identified as the main cause of poor results outside the effective frequency band. Factors that affect the frequency band of effective ADS were numerically investigated. For highly dispersive materials, the end reflection pulse does not fully develop before the arrival of subsequent multiple reflections, resulting in severe truncation error and decreasing the upper frequency of effective ADS. Methods to estimate and extend the frequency band of effective ADS were further proposed. The simple procedures behind PVA, and its computationally efficient nature, make this method suitable for field monitoring. The resultant ADS is a potential improvement to current applications utilizing a travel time approach.