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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作，涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.

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Author: search.filters.author.Whang, Wha-TzongSubject: search.filters.subject.polyimide

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Now showing 1 - 4 of 4
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    Effect of phosphate surface pretreatment on corrosion resistance and adhesion of PI coating on Mg-5 wt.% Sn alloy
    (2015-06-18)
    Lee, Hsiao-Chien
    ;
    Huang, Yi-Chia
    ;
    Liu, Tzeng-Feng
    ;
    Whang, Wha-Tzong
    ;
    Chao, Chuen-Guang
    In this study, phosphate surface pretreatment (PSPT) and poly[pyromellitic dianhydride-co-4,4MODIFIER LETTER PRIME-oxydianiline] polyimide (PMDA-ODA PI) coating were used to provide corrosion protection for Mg-5 wt.% Sn alloy. PSPT enhanced the adhesion of PI coating by mechanical interlocking and chemical anchoring. Surface roughness was increased and provided stronger mechanical interlocking. Phosphates were formed on the alloy surface to act as anchor groups. Energy dispersive X-rayspectrometer and X-ray photoelectron spectroscopy results indicated that bonds formed between anchor groups and PI coating. The bonds provided chemical anchoring and enhanced the adhesion of PI coating. The increase of corrosion resistance of PI coating on Mg-5 wt.% Sn alloy (E-corr = -0.86V/SCE, [GRAPHICS] mu A cm(-2) and corrosion rate far less than [GRAPHICS] showed the bonds were stable enough to stand the attack of electrolyte and inhibit the electrochemical reaction at the interface.
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    Effect of backbone on the biaxial retardation of polyimide films in uniaxial stretch
    (2007-05-15)
    King, Jinn-Shing
    ;
    Whang, Wha-Tzong
    ;
    Lee, Wen-Chin
    ;
    Chang, Li-Ming
    ;
    材料科學與工程學系
    A biaxial-retardation film prepared from the uniaxial-stretched polyimide (PI) film was developed for compensating the viewing angle of liquid-crystal displays. Good uniformity of in-plane bireffingence in well-stretched PI films was observed visually with two crossed polarizers. The prism coupling method was used to measure the n(x), n(y), n(z), and thickness of the stretched PI films. The birefringence variations of n, - n, (difference of refractive indices between x- and y-axes) and n(x) - n(z) during the stretching process were highly affected by PI structure. The polarizability tensors and intrinsic birefringences of the PI repeat units were estimated by Gaussian 98W. It was found that the stretch-induced birefringence is more related to the average polarizability per volume at the low elongation period. (C) 2006 Elsevier B.V. All rights reserved.
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    Structural effect on stretch-induced birefringence in polyimide films
    (2007-10-01)
    King, Jinn-Shing
    ;
    Lee, Wen-Chin
    ;
    Chang, Li-Ming
    ;
    Whang, Wha-Tzong
    ;
    材料科學與工程學系
    Seven polyimides (Pls) of low glass transition temperature were synthesized and their films were uniaxially stretched to observe the variation in their in-plane birefringence (An). The intrinsic birefringences (triangle n degrees) of their polymer chains were also estimated using the experimental average refractive indices and computationally calculated polarizability tensors. The observed stretch-induced An was markedly affected by the PI structure. A model that shows a good fit to experimental data is proposed to predict the orientation degree of PI chains in different PI films. The model, when combined with the analysis of the estimated An's, is useful in explaining the behavior of stretch-induced triangle ns in PI films.
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    Chemical formation of palladium-free surface-nickelized polyimide film for flexible electronics
    (2008-04-30)
    Hsiao, Yu-Sheng
    ;
    Whang, Wha-Tzong
    ;
    Wu, Sheng-Chang
    ;
    Chuang, Kuen-Ru
    ;
    材料科學與工程學系
    Flexible polyimide (PI) films for flexible electronics were surface-nickelized using a fully solution-based process and excellent adhesion between the nickel and polyimide phases was observed. Polyimide substrates were modified by alkaline hydrolysis, ion exchange, reduction and nickel electroless deposition without palladium. Atomic force microscopy and field emission scanning electron microscopy were used to follow the growth of nickel nanoparticles (Ni-NPs) and nickel layers on the polyimide surface. The surface resistances of the Ni-NPs/PI films and Ni/PI films, measured using a four-point probe, were 1.6x10(7) and 0.83 Omega/cm(2), respectively. The thicknesses of Ni-NPs and the Ni layer on the polyimide surface were 82 nm and 382 nm, respectively, as determined by transmission electron microscopy, and the Ni layer adhered well to PI, as determined by the adhesive tape testing method. (c) 2008 Elsevier B.V. All rights reserved.