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Author: search.filters.author.Wu, C. H.Subject: search.filters.subject.critical value

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Now showing 1 - 5 of 5
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    A note on production yield measure for multiple lines
    (2016)
    Pearn, W. L.
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    Tai, Y. T.
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    Wu, C. H.
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    工業工程與管理學系
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    Department of Industrial Engineering and Management
    In today\'s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices C-pk and C-pu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines C-pk(M) and C-pu(M) are considered and the approximate distributions of two natural estimators C-pk(M) and C-pu(M) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.
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    Item type:Item,
    Estimating Process Capability Index C-p with Various Sample Types: A Practical Implementation
    (2015-07-01)
    Wu, C. H.
    ;
    Pearn, W. L.
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    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    Process precision index Cp has been used widely in the manufacturing industry for measuring process potential and precision. In practice, sample data with various types such as one single random sample, multiple random samples, control chart samples, and samples with gauge measurement errors may be employed to estimate the Cp index for evaluating the process potential capability. If the process is perfectly centered in the specification range, the percentage of process non-conforming (%NC) can be expressed by Cp index. In this paper, a review for estimating and testing of Cp index is presented. Some efficient MATLAB programs and illustrative examples are also provided for each type of sample data.
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    An Effective Procedure for Supplier Selection Applied to Glass Substrate Processes with Multiple Lines
    (2014-11-01)
    Pearn, W. L.
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    Wu, C. H.
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    Chuang, C. C.
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    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    In this paper, we consider a supplier selection problem, which compares two glass substrate processes with multiple lines and selects the one that has a higher capability. A test statistic obtained by a subtraction method is employed to establish a hypothesis test with two phases. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for various designated selection powers and confidence levels are also investigated. Practitioners can use the proposed method to make reliable decisions. This paper presents a real-world case of a glass substrate process. The selection procedure uses data to reach a decision in supplier selection. We compare the results of the division method to the proposed subtraction method. The results show that the proposed subtraction method is indeed more powerful than the division method.
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    Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines
    (2013-10-01)
    Pearn, W. L.
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    Wu, C. H.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    The process yield is the most common criterion considered for decision making in supplier selection problem. For normally distributed processes with multiple independent lines, the SpkM index provides an exact measurement for the overall yield. Therefore, the SpkM index can be implemented to deal with the supplier selection problem with processes having multiple independent lines. In this article, a test statistic obtained by a division method is employed to establish a hypothesis testing procedure, with two phases, which is developed to determine whether two suppliers are equally capable or not. The sampling distribution and the probability density function of the test statistic are derived. For various minimum requirements of process capability, number of lines, sample sizes, magnitudes of the difference between the two suppliers and the type I error, the critical values for decision making are presented. The required sample sizes for various designated powers at given type I error are tabulated. A thin-film transistor type liquid-crystal display application example is provided to demonstrate the testing procedure. Copyright (c) 2012 John Wiley & Sons, Ltd.
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    Item type:Item,
    Supplier Selection for Processes with Multiple Characteristics Based on Testing Capability Index C-pk
    (2013-07-01)
    Pearn, W. L.
    ;
    Wu, C. H.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    Supplier selection is the problem which deals with comparing two processes and selecting a better one that has a higher process capability. In this article, the generalization C-pk(T) index is employed to deal with this problem. The generalization C-pk(T) index measures the overall yield for the processes with multiple independent quality characteristics. Based on the generalization C-pk(T) index, a hypothesis testing with two phases is developed to determine whether or not new supplier is better. It allows one to select the supplier with better quality. A test statistic by division method and its corresponding sampling distribution are derived. For various process minimum requirements, magnitudes of the difference between the two processes, unequal sample sizes of two processes, and alpha-risk, the critical values of the tests are tabulated. An application example is presented to illustrate the practicality of the proposed approach. Practitioners can use the proposed method to make reliable decisions in supplier selection problem.