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Author: search.filters.author.Wu, C. H.Subject: search.filters.subject.critical values

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    Item type:Item,
    A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
    (2013-03-01)
    Pearn, W. L.
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    Wu, C. H.
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    Tsai, M. C.
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    工業工程與管理學系
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    Department of Industrial Engineering and Management
    The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.
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    Item type:Item,
    An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
    (2013-03-01)
    Pearn, W. L.
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    Wu, C. H.
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    Hung, H. N.
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    Kao, C. M.
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    統計學研究所
    In statistical quality control, product acceptance determination is an important problem for producer and consumer. In practical, particularly more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we investigate the lot sentencing problem for normally distributed process with one-sided specification and multiple characteristics. We not only provide a simple procedure to help practitioners make reliable decision easily but also tabulate the required sample size and the corresponding critical acceptance value for various producer's and consumer's risks with the capability requirements AQL (acceptable quality level) and LTPD (lot tolerance percent defective). Copyright (c) 2012 John Wiley & Sons, Ltd.