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Author: search.filters.author.Wu, C. H.Subject: search.filters.subject.multiple characteristics

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Now showing 1 - 5 of 5
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    Supplier Selection for Processes with Multiple Characteristics Based on Testing Capability Index C-pk
    (2013-07-01)
    Pearn, W. L.
    ;
    Wu, C. H.
    ;
    工業工程與管理學系
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    Department of Industrial Engineering and Management
    Supplier selection is the problem which deals with comparing two processes and selecting a better one that has a higher process capability. In this article, the generalization C-pk(T) index is employed to deal with this problem. The generalization C-pk(T) index measures the overall yield for the processes with multiple independent quality characteristics. Based on the generalization C-pk(T) index, a hypothesis testing with two phases is developed to determine whether or not new supplier is better. It allows one to select the supplier with better quality. A test statistic by division method and its corresponding sampling distribution are derived. For various process minimum requirements, magnitudes of the difference between the two processes, unequal sample sizes of two processes, and alpha-risk, the critical values of the tests are tabulated. An application example is presented to illustrate the practicality of the proposed approach. Practitioners can use the proposed method to make reliable decisions in supplier selection problem.
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    A Close Form Solution for the Product Acceptance Determination Based on the Popular Index C-pk
    (2013-07-01)
    Pearn, W. L.
    ;
    Wu, C. H.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    Product acceptance determinations are practical tools for quality control applications involving quality contract on product orders between the vendor and the buyer. It provides the vendor and the buyer rules for product acceptance to meet the preset product quality requirement. As the rapid advancement of manufacturing technology, more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we introduce an efficient product acceptance procedure on the basis of the generalization C-pk(T) index, to deal with lot sentencing problem with very low fraction of defectives. We tabulate the required sample size n and the corresponding critical acceptance value c(0) for various alpha-risk, beta-risk, and the levels of the lot fraction of defectives that correspond to acceptance and rejecting quality levels. Practitioners can use the proposed method to make reliable decisions in product acceptance. Copyright (C) 2012 John Wiley & Sons, Ltd.
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    Supplier Selection for Multiple-Characteristics Processes with One-Sided Specifications
    (2013-03-01)
    Pearn, W. L.
    ;
    Wu, C. H.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    In this paper, we consider the supplier selection problem for normally distributed processes with multiple independent characteristics based on process capability index C-PU(T). A two-phase testing procedure based on the quotient of two statistics is proposed to deal with the problem. We obtain the sampling distribution and the probability density function of the quotient. Several tables of the critical values for the testing procedure and decision making are provided. The required sample sizes for various capability requirements, magnitude of difference of two suppliers, and given power are also presented. A real application on TFT-LCD manufacturing processes is presented to demonstrate the efficacy of the proposed method.
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    A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
    (2013-03-01)
    Pearn, W. L.
    ;
    Wu, C. H.
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    Tsai, M. C.
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    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.
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    Item type:Item,
    An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
    (2013-03-01)
    Pearn, W. L.
    ;
    Wu, C. H.
    ;
    Hung, H. N.
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    Kao, C. M.
    ;
    統計學研究所
    In statistical quality control, product acceptance determination is an important problem for producer and consumer. In practical, particularly more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we investigate the lot sentencing problem for normally distributed process with one-sided specification and multiple characteristics. We not only provide a simple procedure to help practitioners make reliable decision easily but also tabulate the required sample size and the corresponding critical acceptance value for various producer's and consumer's risks with the capability requirements AQL (acceptable quality level) and LTPD (lot tolerance percent defective). Copyright (c) 2012 John Wiley & Sons, Ltd.