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Author: search.filters.author.Wu, C. H.Subject: search.filters.subject.process capability index

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Now showing 1 - 4 of 4
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    Estimating Process Capability Index C-p with Various Sample Types: A Practical Implementation
    (2015-07-01)
    Wu, C. H.
    ;
    Pearn, W. L.
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    工業工程與管理學系
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    Department of Industrial Engineering and Management
    Process precision index Cp has been used widely in the manufacturing industry for measuring process potential and precision. In practice, sample data with various types such as one single random sample, multiple random samples, control chart samples, and samples with gauge measurement errors may be employed to estimate the Cp index for evaluating the process potential capability. If the process is perfectly centered in the specification range, the percentage of process non-conforming (%NC) can be expressed by Cp index. In this paper, a review for estimating and testing of Cp index is presented. Some efficient MATLAB programs and illustrative examples are also provided for each type of sample data.
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    A powerful test for two-sided multiple independent characteristics supplier selection problem
    (2015-03-04)
    Wu, C. H.
    ;
    Pearn, W. L.
    ;
    Chuang, C. C.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    In this article, we consider the supplier selection problem for two-sided processes with multiple independent characteristics. We review the existing division method and develop a new exact approach called the subtraction method. For practical applications, a two-phase selection procedure is established based on the subtraction method. The decision powers of two methods are compared. We show that the subtraction method we proposed is indeed more powerful than the existing division method. Several figures are presented to display the required sample sizes with various powers and various values of (C-pk1(T), C-pk2(T)). For the convenience of practitioners, the required sample sizes for the two methods with various powers and various values of (C-pk1(T), C-pk2(T))) are also tabulated.
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    Item type:Item,
    An Effective Procedure for Supplier Selection Applied to Glass Substrate Processes with Multiple Lines
    (2014-11-01)
    Pearn, W. L.
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    Wu, C. H.
    ;
    Chuang, C. C.
    ;
    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    In this paper, we consider a supplier selection problem, which compares two glass substrate processes with multiple lines and selects the one that has a higher capability. A test statistic obtained by a subtraction method is employed to establish a hypothesis test with two phases. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for various designated selection powers and confidence levels are also investigated. Practitioners can use the proposed method to make reliable decisions. This paper presents a real-world case of a glass substrate process. The selection procedure uses data to reach a decision in supplier selection. We compare the results of the division method to the proposed subtraction method. The results show that the proposed subtraction method is indeed more powerful than the division method.
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    Item type:Item,
    A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
    (2013-03-01)
    Pearn, W. L.
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    Wu, C. H.
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    Tsai, M. C.
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    工業工程與管理學系
    ;
    Department of Industrial Engineering and Management
    The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.