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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作,涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.
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Item type:Item, A 918MHz Wide-Range CMOS Rectifier with Diode-Feeding and Switch-Capacitor-Based Load Modulation Technique(2019-01-01) ;Kuo, Chen-Yi ;Lu, Chun-An ;Liao, Yu-Te ;交大名義發表National Chiao Tung UniversityThis paper presents a wide-input-range rectifier design with a diode-feeding (DF) architecture and load modulation. Dynamically-biased diodes are connected to the gates of the rectifying transistors to create bias voltage differences for PMOS and NMOS devices and the isolation of the reverse currents at different input power levels. Also, the switch-capacitor-based load modulation scheme is proposed to achieve optimal efficiency over wide-range load current deviations automatically. The proposed four-stage rectifier design was fabricated using 65nm CMOS technology and occupies a silicon area of 0.92 x 0.27mm(2). The measured sensitivity of the rectifier is -15dBm at 1M Omega load, and the peak power conversion efficiency is 28% at a load of 22k Omega With the load modulation scheme, the conversion efficiency is enhanced by >10% in a load current from 7 mu A to 35 mu A, when compared to a design without the load modulation scheme.Item type:Item, Differential Low Noise Amplifier for S-Band Phased-Array Radar in 0.18-mu m CMOS Technology(2019-01-01) ;Hsia, Tzu-Yu ;Li, Xin-Yi ;Yang, Liang-Yu Ou ;Tsai, Zuo-MinChen, Shih-YuanAn S-hand differential low noise amplifier (DLNA) is presented and implemented in TSMC 0.18-mu m CMOS process for use in the receiver of a phased-array radar. A special layout approach is used in the input matching circuit by integrating two individual inductors together to shrink the chip area while increasing the inductances. The 3-dB gain bandwidth of the two-stage DLNA ranges from 1.9 to 4 GHz (72.41%). The measured gain is about 18.5 dB with an average in-band noise figure of 5.77 dB. The chip area is 0.4672 mm(2).Item type:Item, A 94 GHz 10.8 mW Low-Noise Amplifier With Inductive Gain Boosting in 40 nm Digital CMOS Technology(2019-01-01) ;Yeh, Po-Chen ;Kuo, Chien-Nan ;交大名義發表National Chiao Tung UniversityA W-band low-power, low-noise amplifier is designed and fabricated in 40 nm digital CMOS technology. The method of inductive gain boosting is utilized without extra power consumption. The circuit only consumes 10.8 mW dc power with a supply voltage of 1 V. The measured peak power gain achieves 14.5 dB at 93 GHz, while the minimum noise figure is 6.4 dB at 89 GHz. The circuit occupies a core area of only 0.07 mm(2).Item type:Item, Fabrication of Vertically Stacked Nanosheet Junctionless Field-Effect Transistors and Applications for the CMOS and CFET Inverters(2020-09-01) ;Sung, Po-Jung ;Chang, Shu-Wei ;Kao, Kuo-Hsing ;Wu, Chien-TingSu, Chun-JungIn this study, conventional CMOS and complementary field-effect transistor (CFET) inverters based on a vertically stacked-nanosheet (NS) structure were fabricated. The NS below 8-nm channel layer thickness (T-Si) was obtained by dry etching and wet etching processes. The channel thickness is controlled by dry etching, and the channel width was shrunk down by wet etching. Compared to single nanowire field-effect transistors (NSFETs), stacked NSFETs exhibit higher ON-current performance. For the CMOS inverter, the voltage transfer characteristics (VTCs) could be matched much better by adjusting the channel widths and layers for N-channel MOSFET (NFET) and P-channel MOSFET (PFET), respectively. For the CFET inverter, layout areas could be reduced and requires less number of lithographic and ion implantation steps contrary to the CMOS inverter. However, we observe that the VTCs of the CFET inverters still show asymmetric behavior due to the difficulties of adjustment in NS layers and systematic behavior of threshold voltages for NFETs/PFETs. This work experimentally demonstrates the CMOS and CFET inverters on the vertically stacked NS structure, which is promising for system-on-panel (SoP) and 3-D-ICs applications.Item type:Item, Essential factors that affect bioelectricity generation byRhodopseudomonas palustrisstrainPS3in paddy soil microbial fuel cells(1970-01-01) ;Liu, Chia-Hung ;Lee, Sook-Kuan ;Ou, I-Che ;Tsai, Kun-JuLee, YuA plant-associated phototrophic bacterium,R. palustrisstrain PS3, was inoculated into a soil-based MFC to generate electricity. We evaluated the performance of this soil-based microbial fuel cell (MFC) and elucidated the essential factors that contributed to power generation. PS3 showed the potential to enhance power generation, especially when the apparatus was operated in a sealed chamber with illumination.We deduced that the improved power performance was due to the enhanced electron transport through the living electrode that was grown as a PS3 biofilm via photoheterotrophic metabolism. In addition, we suggested that the interplay between phototrophic fixation of ambient CO(2)and anaerobic oxidation of ferrous iron in soil was also involved in the increased power output. We implemented CMOS (complementary metal-oxide-semiconductor) technology with the soil-based MFC to harvest energy in a more efficient and stable manner. The above system is expected to provide a potentially low-cost and low-energy system with a high power conversion efficiency for practical applications in the future.Item type:Item, Wirelessly-Powered Printed Temperature Sensor with an Ultra-Low-Power and High-Sensitivity CMOS Readout IC(2019-01-01) ;Lu, Shao-Yung ;Wu, I-Feng ;Liao, Ying-Chih ;Liao, Yu-Te電機工程學系This paper presents a wirelessly-powered high-sensitivity printed temperature sensor (TS). The proposed system consists of a -17dBm sensitivity RF-DC conversion circuit, a 2.2 mu W readout interface, and a printed NiO thermistor sensor. The 1 mm(2) printed NiO film has a good sensitivity index (B value) of 4000 K, but has high resistance (M Omega). The conventional readout system has difficulty detecting small resistance changes in the large thermal resistance range while only consuming a few microwatts, which is a need for enabling RF-power sensors remotely. A low-noise readout IC was designed to convert the resistance changes to digital codes. The proposed TS achieves a resolution of 0.04 degrees C/code in a temperature range of -20 degrees C to 90 degrees C, and measurement deviation within +/- 1.1%, while consuming only 2.2 nJ per conversion.Item type:Item, A New Compact Model for Accurate Simulation of RF Noise in Sub-40nm Multi-finger nMOSFETs(2018-01-01) ;Guo, Jyh-Chyurn ;Yeh, Kuo-Liang ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA new compact model has been developed in this paper for accurate simulation of RF noise and extraction of actual intrinsic noise in sub-40 nm multi-finger nMOSFETs. This model can predict and verify the excess noise sources before and after deembedding, the mechanism responsible for the complicated layout dependence in various noise parameters, and facilitate optimization design for low noise devices and circuits in nanoscale CMOS technology.Item type:Item, Investigation of Inversion Charge Characteristics and Inversion Charge Loss for InGaAs Negative-Capacitance Double-Gate FinFETs Considering Quantum Capacitance(2020-01-01) ;Huang, Shih-En ;Lin, Shih-Han ;Su, Pin ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsThis paper investigates the inversion charge characteristics and quantum-capacitance induced inversion charge loss for In0.53Ga0.47As negative-capacitance FinFETs (NC-FinFETs) using theoretical calculation corroborated with numerical simulation. Our study indicates that, the boost of inversion charges due to negative capacitance increases with increasing remnant polarization P-r. In addition, the inversioncharge boosting for the In0.53Ga0.47As device is significantly larger than that of the Si (110) device due to the step-like inversion capacitance characteristic stemming from the 2D density-of-states of the In0.53Ga0.47As device. In other words, the quantum-capacitance induced inversion-charge loss for III-V channel can be mitigated in NCFETs.Item type:Item, A 19.1% PAE, 22.4-dBm 53-GHz Parallel Power Combining Power Amplifier with Stacked-FET Techniques in 90-nm CMOS(2019-01-01) ;Sun, Wei-Che ;Kuo, Chien-Nan ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA two-stage fully integrated 53-GHz stacked-FET power amplifier (PA) is implemented in 90-nm bulk CMOS. The output stage is optimized to achieve high output power while maintaining high power added efficiency (PAE). The complete PA achieves a measured saturated output power of 22.4 dBm and the 19.1% PAE at 2.4 V supply. It has -3 dB bandwidth of 8.8 GHz.Item type:Item, A W-Band 6.8 mW Low-Noise Amplifier in 90 nm CMOS Technology Using Noise Measure(2019-01-01) ;Yeh, Po-Chen ;Kuo, Chien-Nan ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA W-band low-noise amplifier consisting of seven common-source transistor stages is designed using noise measure as the figure of merit for circuit optimization. Fabricated in 90 nm CMOS technology, the die size is 0.38 mm(2), while the core active area only 0.1 mm(2). The circuit gives peak power gain of 21.5 dB at 90 GHz and noise figure of 8.3 dB, with dc power consumption of only 6.8 mW.