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Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C-pk
(2011-12-01)
Pearn, W. L.
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Shiau, J. -J. H.
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Tai, Y. T.
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Li, M. Y.
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統計學研究所
Process capability index C-pk is the most popular capability index widely used in the manufacturing industry. Existing research on the yield-based measure index C-pk to date is restricted to processes with single characteristics. However, many manufacturing processes are commonly described with multiple characteristics, for example, the gold bumping process in the TFT-LCD (thin film transistor-liquid crystal display) manufacturing industry. In the gold bumping process, gold bumps have multiple characteristics all having effects on the process yield. Obtaining accurate gold bumping manufacturing yield is very important for quality assurance and in providing guidance toward process improvement. To obtain accurate yield assessment for processes with multiple characteristics, we propose a new overall yield-measure index C-pk(T), which is a generalization of the index C-pk, and a natural estimator (C) over cap (T)(pk) of C-pk(T). For the purpose of making inferences on the process capability, we derive a quite accurate approximation of the distribution of (C) over cap (T)(pk) since the distribution is analytically intractable. With this distribution, we tabulate the lower confidence bounds of the new index under various sample sizes for in-plant applications. In addition, we construct a statistical test on the new yield-measure index in order to examine whether the yield meets the customers' requirements. For illustration purpose, a real case in a gold bumping factory located in the Science-based Industrial Park at Hsinchu, Taiwan is presented. Copyright (C) 2011 John Wiley & Sons, Ltd.
Capability measures for processes with multiple characteristics
(2003-03-01)
Chen, KS
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Pearn, WL
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Lin, PC
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工業工程與管理學系
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Department of Industrial Engineering and Management
Process capability indices, such as C-p, C-a, and C-pk, have been widely used in the manufacturing industry providing numerical measures on process precision, process accuracy, and process performance. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively neglected In this paper, we consider a generalization of the yield index S-pk proposed by Boyles, for processes with multiple characteristics. We establish a relationship between the generalization and the process yield. We also develop a control chart based on the proposed generalization, which displays all the characteristic measures in one single chart. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously. Copyright (C) 2003 John Wiley Sons, Ltd.
Measuring manufacturing capability for couplers and wavelength division multiplexers
(2005)
Wu, CW
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Pearn, WL
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工業工程與管理學系
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Department of Industrial Engineering and Management
The couplers and wavelength division multiplexers have been widely used in high-speed, high-volume image data transmission systems to provide sufficient bandwidth and smaller channel spacing for greater throughput. In this paper, we develop a method for measuring the manufacturing capability of a process making couplers and wavelength division multiplexers. The proposed method measures the process capability of reproducing product items meeting the manufacturing specifications where multiple product quality characteristics are involved, including the polarization dependent loss, and the insertion loss, which are critical in fiber-optic transmission quality.
Supplier Selection for Processes with Multiple Characteristics Based on Testing Capability Index C-pk
(2013-07-01)
Pearn, W. L.
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Wu, C. H.
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工業工程與管理學系
;
Department of Industrial Engineering and Management
Supplier selection is the problem which deals with comparing two processes and selecting a better one that has a higher process capability. In this article, the generalization C-pk(T) index is employed to deal with this problem. The generalization C-pk(T) index measures the overall yield for the processes with multiple independent quality characteristics. Based on the generalization C-pk(T) index, a hypothesis testing with two phases is developed to determine whether or not new supplier is better. It allows one to select the supplier with better quality. A test statistic by division method and its corresponding sampling distribution are derived. For various process minimum requirements, magnitudes of the difference between the two processes, unequal sample sizes of two processes, and alpha-risk, the critical values of the tests are tabulated. An application example is presented to illustrate the practicality of the proposed approach. Practitioners can use the proposed method to make reliable decisions in supplier selection problem.
A Close Form Solution for the Product Acceptance Determination Based on the Popular Index C-pk
(2013-07-01)
Pearn, W. L.
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Wu, C. H.
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工業工程與管理學系
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Department of Industrial Engineering and Management
Product acceptance determinations are practical tools for quality control applications involving quality contract on product orders between the vendor and the buyer. It provides the vendor and the buyer rules for product acceptance to meet the preset product quality requirement. As the rapid advancement of manufacturing technology, more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we introduce an efficient product acceptance procedure on the basis of the generalization C-pk(T) index, to deal with lot sentencing problem with very low fraction of defectives. We tabulate the required sample size n and the corresponding critical acceptance value c(0) for various alpha-risk, beta-risk, and the levels of the lot fraction of defectives that correspond to acceptance and rejecting quality levels. Practitioners can use the proposed method to make reliable decisions in product acceptance. Copyright (C) 2012 John Wiley & Sons, Ltd.
Supplier Selection for Multiple-Characteristics Processes with One-Sided Specifications
(2013-03-01)
Pearn, W. L.
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Wu, C. H.
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工業工程與管理學系
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Department of Industrial Engineering and Management
In this paper, we consider the supplier selection problem for normally distributed processes with multiple independent characteristics based on process capability index C-PU(T). A two-phase testing procedure based on the quotient of two statistics is proposed to deal with the problem. We obtain the sampling distribution and the probability density function of the quotient. Several tables of the critical values for the testing procedure and decision making are provided. The required sample sizes for various capability requirements, magnitude of difference of two suppliers, and given power are also presented. A real application on TFT-LCD manufacturing processes is presented to demonstrate the efficacy of the proposed method.
A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
(2013-03-01)
Pearn, W. L.
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Wu, C. H.
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Tsai, M. C.
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工業工程與管理學系
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Department of Industrial Engineering and Management
The generalized yield index C-pk(T) establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index C-PU(T) was considered, and the asymptotic distribution of the natural estimator (C)over-cap(PU)(T) was developed. Then, we derived the lower confidence bounds as well as the critical values of index C-PU(T). We not only provided some tables but also presented an application example. Copyright (c) 2012 John Wiley & Sons, Ltd.
An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
(2013-03-01)
Pearn, W. L.
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Wu, C. H.
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Hung, H. N.
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Kao, C. M.
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統計學研究所
In statistical quality control, product acceptance determination is an important problem for producer and consumer. In practical, particularly more than one quality characteristic must be simultaneously considered to improve the product quality because of the product design. In this article, we investigate the lot sentencing problem for normally distributed process with one-sided specification and multiple characteristics. We not only provide a simple procedure to help practitioners make reliable decision easily but also tabulate the required sample size and the corresponding critical acceptance value for various producer's and consumer's risks with the capability requirements AQL (acceptable quality level) and LTPD (lot tolerance percent defective). Copyright (c) 2012 John Wiley & Sons, Ltd.
An Effective Powerful Test for Supplier Selection Evaluation with Multiple Characteristics
(2012-07-01)
Pearn, W. L.
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Tai, Y. T.
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Wang, C. Y.
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工業工程與管理學系
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Department of Industrial Engineering and Management
"Supplier selection in high-tech manufacturing industries has become more essential and has received considerable attention. In this paper, we consider a supplier selection problem with multiple characteristics in which we compare two-sided processes with multiple characteristics and select the better one with the higher capability. We first review an approach referred to as the division method. We then develop a new approach called the subtraction method. We compare the two methods in terms of their selection power. The results show that the proposed subtraction method is indeed more powerful than the division method. Two supplier-selection procedures are developed for practical applications. For practitioners' convenience in applying our procedures, the various sample sizes required for designated selection powers are tabulated and discussed. For illustration purposes, a case is considered and solved for supplier selection evaluation."
An Effective Test for Supplier Selection Evaluation with Multiple Characteristics
(2011-11-01)
Tai, Y. T.
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Pearn, W. L.
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You, S. K.
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工業工程與管理學系
;
Department of Industrial Engineering and Management
Recently, the extensive applications of thin-film transistor liquid crystal display (TFT-LCD) products have been increasing rapidly (for example, smart phones, monitors, and liquid crystal display televisions). Supplier selection in TFT-LCD manufacturing industries has become more essential and has received considerable attention. It is a problem of comparing two suppliers and selecting the one that has a significantly higher process capability. In this paper, we consider an effective test to determine supplier selection for glass substrate processes with multiple characteristics using the yield index S(pk)(T), which can provide an exact measure of the process yield. In order to determine the selection decisions, critical values of the hypothesis testing for two procedures are calculated. For the practitioners' convenience in applying our procedures, various sample sizes required for designated selection powers are tabulated and discussed. For illustration purposes, a real-world problem in TFT-LCD factories is considered and solved for supplier selection evaluation.

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