完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Y. C. | en_US |
dc.contributor.author | Chiu, C. H. | en_US |
dc.contributor.author | Fan, W. C. | en_US |
dc.contributor.author | Chia, C. H. | en_US |
dc.contributor.author | Yang, S. L. | en_US |
dc.contributor.author | Chuu, D. S. | en_US |
dc.contributor.author | Lee, M. C. | en_US |
dc.contributor.author | Chen, W. K. | en_US |
dc.contributor.author | Chang, W. H. | en_US |
dc.contributor.author | Chou, W. C. | en_US |
dc.date.accessioned | 2014-12-08T15:12:58Z | - |
dc.date.available | 2014-12-08T15:12:58Z | - |
dc.date.issued | 2007-12-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.2826936 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/10005 | - |
dc.description.abstract | The vibrational, electronic, and crystalline properties of n-type chlorine-doped ZnSe (ZnSe:Cl) layers with a carrier concentration from 8.2x10(15) to 1.8x10(18) cm(-3) are studied by Raman spectroscopy. The spectral line shapes of the longitudinal-optical-phonon and plasmon coupling mode are analyzed using the Raman scattering efficiency and the dielectric function to obtain the electron densities and mobility. The splitting of the transverse-optical (TO) phonon and the redshift of the chlorine-related impurity vibration mode are clearly observed when pressure is applied. The semiconductor-to-metal phase transition pressure of ZnSe:Cl layers declines as the carrier concentration increases, indicating that n-type doping reduces crystal stability. Additionally, the pressure-induced weakening of the longitudinal-optical-phonon-plasmon coupling efficiency suggests that pressure tends to degrade the n-type characteristic of ZnSe:Cl because of the emergence of the new deep donorlike state. (c) 2007 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Raman scattering of longitudinal-optical-phonon-plasmon coupling in Cl-doped ZnSe under high pressure | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.2826936 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 102 | en_US |
dc.citation.issue | 12 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000251987600031 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |