探針式熱電功率因子量測系統之研發

Abstract

近年來由於綠色能源工業的快速成長，熱電材料因而再度受到學界及業界的重視。 拜奈米科技的進步及熱電相關新理論的發展，越來越多的高優值係數熱電材料相繼 被發現。鑑於日益增加之熱電材料性質量測需求，本研究計畫提出一種整合型高效 率熱電功率因子量測系統；此系統主要結合「變溫四點探針量測系統」以及「紅外 線熱影像儀」。此系統除了能夠符合材料多樣性之需求，可在不同溫度之下量測各 式尺寸及材料種類（塊材到薄膜）之熱電功率因子。其可即時移動之探針亦能精確 提供不同區塊位置之平均熱電功率因子。

Thermoelectric materials have recently reattracted much attention due to the rapid growth of various clean-energy industries. With the great development of nanotechnologies and new concepts, a series of novel thermoelectric materials with comparable high figure of merit have been widely discovered. For the urgent demand of the effect measurement of the thermoelectric power factor, a unique characterization system which combines high-temperature four-probe electrical measurement and infared thermography technique are newly proposed. This system can be applied to various materials from bulk to thin films with a wide range of specimen size under different temperatures. The dynamic movement of the probes can also provide accurate averaged results obtained from differnet regions selected.