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dc.contributor.authorLin, Chun-Tingen_US
dc.contributor.authorHuang, Yang-Tungen_US
dc.contributor.authorHuang, Jung-Yawen_US
dc.date.accessioned2014-12-08T15:13:13Z-
dc.date.available2014-12-08T15:13:13Z-
dc.date.issued2007-11-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.46.7356en_US
dc.identifier.urihttp://hdl.handle.net/11536/10203-
dc.description.abstractThe spectral performance of a demultiplexer is significantly affected by the phase and amplitude errors due to fabrication errors. We estimate the impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexer using a design example. Simulation results show that the photomask resolution resulting in a phase error should be lower than 40 nm when a crosstalk criterion of -30 dB is given. The impact of amplitude errors is not distinct until the reduced amount of the facet width is greater than 0.5 mu m and the grating side-wall angle offset from the vertical is larger than 1 degrees.en_US
dc.language.isoen_USen_US
dc.subjectplanar waveguideen_US
dc.subjectetched diffraction gratingen_US
dc.subjectflat-topen_US
dc.subjectcrosstalken_US
dc.subjectinsertion lossen_US
dc.subjectphase and amplitude errorsen_US
dc.subjectwavelength-division multiplexing (WDM)en_US
dc.titleThe impact of fabrication errors on a flat-top grating-based planar waveguide demultiplexeren_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.46.7356en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERSen_US
dc.citation.volume46en_US
dc.citation.issue11en_US
dc.citation.spage7356en_US
dc.citation.epage7358en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000251220000038-
dc.citation.woscount0-
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