統計資料
總造訪次數
| 檢視 | |
|---|---|
| Design of 2xVDD-tolerant I/O buffer with considerations of gate-oxide reliability and hot-carrier degradation | 106 |
本月總瀏覽
檔案下載
| 檢視 | |
|---|---|
| 000255014801130.pdf | 2 |
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 97 |
| 美國 | 8 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 5 |
| Kensington | 3 |
| Beijing | 1 |
| 檢視 | |
|---|---|
| Design of 2xVDD-tolerant I/O buffer with considerations of gate-oxide reliability and hot-carrier degradation | 106 |
| 檢視 | |
|---|---|
| 000255014801130.pdf | 2 |
| 檢視 | |
|---|---|
| 中國 | 97 |
| 美國 | 8 |
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 5 |
| Kensington | 3 |
| Beijing | 1 |