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dc.contributor.authorLin, J. C.en_US
dc.contributor.authorSu, Y. K.en_US
dc.contributor.authorChang, S. J.en_US
dc.contributor.authorLan, W. H.en_US
dc.contributor.authorHuang, K. C.en_US
dc.contributor.authorChen, W. R.en_US
dc.contributor.authorHuang, C. Y.en_US
dc.contributor.authorLai, W. C.en_US
dc.contributor.authorLin, W. J.en_US
dc.contributor.authorCheng, Y. C.en_US
dc.date.accessioned2014-12-08T15:13:14Z-
dc.date.available2014-12-08T15:13:14Z-
dc.date.issued2007-10-22en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2800813en_US
dc.identifier.urihttp://hdl.handle.net/11536/10225-
dc.description.abstractGallium nitride p-i-n ultraviolet photodiodes with low- temperature (LT)- GaN interlayer have been fabricated. It was found that the dark current of photodiode with LT- GaN interlayer is as small as 143 pA at 5 V reverse bias. It was also found that the responsivity of the photodiode with LT- GaN interlayer can be enhanced at a small electric field (similar to 0.4 MV/cm) due to the carrier multiplication effect. The UV photocurrent gain of 13 and large ionization coefficient (alpha = 3.1 X 10(5) cm(-1)) were also observed in the detector with LT- GaN interlayer. Furthermore, we can achieve a large peak responsivity of 2.27 A/W from the photodiode with LT- GaN interlayer. (C) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleHigh responsivity of GaN p-i-n photodiode by using low-temperature interlayeren_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2800813en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume91en_US
dc.citation.issue17en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000250468200105-
dc.citation.woscount13-
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