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dc.contributor.author吳文偉en_US
dc.contributor.authorWu Wen-Weien_US
dc.date.accessioned2014-12-13T10:51:23Z-
dc.date.available2014-12-13T10:51:23Z-
dc.date.issued2008en_US
dc.identifier.govdocNSC97-2218-E009-027-MY3zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/102663-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1630748&docId=278607en_US
dc.description.abstract近年來電子元件微小化的發展,使得具奈米尺度之功能性材料結構及其 光電特性益受重視。在新世代奈米元件中,奈米點可望應用於單電子電晶 體、高密度記憶體、半導體雷射。而奈米線則被看好應用於導線及具發光 特性之奈米元件。尤其以矽奈米線為基礎,應用於微電子奈米元件之研 究,一直是各個相關領域相當重視的研究方向。在矽晶上,自動對準低電 阻率金屬矽化物仍為下一世代電子元件所需之重要材料。近年來許多矽化 物奈米線之研究亦由於在新世代奈米元件中可望取代金屬導線而成為重 要焦點。在此趨勢下,更發展出利用矽奈米線製作奈米尺度之電晶體,使 其具有取代積體電路上金氧半電晶體之潛力,並對微電子工程及高敏度的 生物檢測器帶來新的契機。為了達成此目標,矽化物/矽奈米線異質結構 成為重要的研究課題。另一方面,自組裝技術(Self-assemble)亦成為未 來最具潛力之奈米製程。利用自組裝技術,可望控制其形狀、尺寸、密度, 並成長規則性之金屬矽化物量子點及奈米線。在相關金屬矽化物奈米線之 研究領域中,近年來有許多重要的成果刊登於知名頂尖期刊,顯見其重要 性。而近年來,本研究團隊亦在此領域發表幾項重要研究成果,也在世界 上居於領先的地位,並且持許往更深入與重要的主題進行研究。本研究計 畫擬分五子題,為期三年進行,各子題間不但相互關聯,也分別有先前研 究所累積的基礎、經驗與初步成果,相信很多研究都能在期間內很有效率 地做出好的結果,以期能對微電子產業的製程及應用上帶來更多的彈性。 以下分別列舉五個子計畫之主題。 1. 低電阻率矽化物奈米線異質結構及其元件特性研究 2. 製備多重且規則之矽化物/矽/矽化物奈米線異質結構及其界面研究 3. 應變矽於矽化物/矽/矽化物奈米線異質結構中之電性研究及影響 4. 利用矽鍺合金奈米線製備矽化物/矽鍺合金/矽化物之奈米線異質結 構,及鍺成分對電性影響之研究 5. 在矽晶及矽鍺合金上成長規則性金屬矽化物奈米線及其電性之研究zh_TW
dc.description.abstractOne-dimensional nanostructures, such nanotubes and nanowires, are attractive building blocks for nanoelectronics since their morphology, size, and electronic properties make them suitable for fabricating both active nanodevice elements and device-to-device interconnects. In particular, substantial efforts have been made for the development of nanoscale transistors based on silicon nanowires due to their potential to replace to conventional planar metal-oxide-semiconductor field-effect transistors (MOSFET) in integrated circuits or to open new opportunities in flexible macroelectronics and highly sensitive biosensors. To realize this potential, the formation of silicide/Si nanowire heterostructures has been studied. The research will be conducted on the investigation on nanostructured metal silicides and their electrical and optical properties. The emphases will be placed on the following topics, 1. Low-resistivity metal silicide nanowire heterostructures and their device properties. 2. Fabrication of multiple and periodic NiSi/Si heterostructure and analysis of interface structures. 3. Effects of strained Si on electrical properties in the NiSi/Si/NiSi nanowire heterostructure. 4. Fabrication of Silicide/SiGe/Silicide nanowire heterostructures using SiGe nanowires and the Ge concentration effect on the electrical properties. 5. Self-assembled low-resistivity metal silicide nanowires on Si and SiGe alloys.en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject低電阻率金屬矽化物zh_TW
dc.subject奈米線zh_TW
dc.subject異質結構zh_TW
dc.subject奈米元件zh_TW
dc.subject電性zh_TW
dc.subject單晶zh_TW
dc.subject應變矽zh_TW
dc.subject自組裝zh_TW
dc.subject奈米點zh_TW
dc.subject矽鍺合金zh_TW
dc.subjectlow-resistivity metal silicidesen_US
dc.subjectnanowiresen_US
dc.subjectheterostructuresen_US
dc.subjectnanodevicesen_US
dc.subjectelectrical propertiesen_US
dc.subjectsingle crystallineen_US
dc.subjectstrained Sien_US
dc.subjectself-assembleen_US
dc.subjectnanodotsen_US
dc.subjectSiGe alloysen_US
dc.title低電阻率金屬矽化物奈米元件及其特性研究zh_TW
dc.titleInvestigation on Low-Resistivity Metal Silicide Nanodevices and Their Propertiesen_US
dc.typePlanen_US
dc.contributor.department國立交通大學材料科學與工程學系(所)zh_TW
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