統計資料
總造訪次數
| 檢視 | |
|---|---|
| Enhanced hole mobility and reliability of panel epi-like silicon transistors using backside green laser activation | 110 |
本月總瀏覽
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| Enhanced hole mobility and reliability of panel epi-like silicon transistors using backside green laser activation | 0 | 0 | 0 | 0 | 2 | 0 | 0 |
檔案下載
| 檢視 | |
|---|---|
| 000249023500004.pdf | 5 |
國家瀏覽排行
| 檢視 | |
|---|---|
| China | 94 |
| United States | 11 |
| Brazil | 1 |
| Canada | 1 |
| Ireland | 1 |
| India | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 94 |
| Menlo Park | 5 |
| Edmond | 3 |
| Kensington | 2 |
| Mumbai | 1 |
| Ottawa | 1 |
| Sacramento | 1 |