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dc.contributor.authorChuang Ching-Teen_US
dc.contributor.authorHsieh Chien-Yuen_US
dc.contributor.authorFan Ming-Longen_US
dc.contributor.authorHu Pi-Hoen_US
dc.contributor.authorSu Pinen_US
dc.date.accessioned2014-12-16T06:14:14Z-
dc.date.available2014-12-16T06:14:14Z-
dc.date.issued2012-05-01en_US
dc.identifier.govdocG11C011/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104584-
dc.description.abstractThe present invention provides a Schmitt trigger-based FinFET static random access memory (SRAM) cell, which is an 8-FinFET structure. A FinFET has the functions of two independent gates. The new SRAM cell uses only 8 FinFET per cell, compared with the 10-FinFET structure in previous works. As a result, the cell structure of the present invention can save chip area and raise chip density. Furthermore, this new SRAM cell can effectively solve the conventional problem that the 6T SRAM cell is likely to have read errors at a low operating voltage.zh_TW
dc.language.isozh_TWen_US
dc.titleSchmitt trigger-based finFET SRAM cellzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08169814zh_TW
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