Full metadata record
DC FieldValueLanguage
dc.contributor.authorChang Edward Yien_US
dc.contributor.authorTang Shih-Hsuanen_US
dc.contributor.authorLin Yue-Cinen_US
dc.date.accessioned2014-12-16T06:14:17Z-
dc.date.available2014-12-16T06:14:17Z-
dc.date.issued2011-10-11en_US
dc.identifier.govdocH01L021/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104636-
dc.description.abstractThe method is disclosed that Si+ is implanted on Si substrate to enhance strain relaxation at the interface between the metamorphic GexSi1−x buffer layers and Si substrate, in order to facilitate the growth of a high quality Ge on Si substrate. And several GexSi1−x buffer layers (Si/Ge0.8Si0.2/Ge0.9Si0.1/Ge) are grown on top of Si substrate by UHVCVD. Then grow pure Ge layer of low dislocation density on GexSi1−x buffer layer. Finally, grow up high efficiency III-V solar cell on GexSi1−x buffer layer.zh_TW
dc.language.isozh_TWen_US
dc.titleMethod for forming a GexSi1-x buffer layer of solar-energy battery on a silicon waferzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08034654zh_TW
Appears in Collections:Patents


Files in This Item:

  1. 08034654.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.