完整後設資料紀錄
DC 欄位語言
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorHsu, Y-Cen_US
dc.contributor.authorShiau, J-J Horngen_US
dc.date.accessioned2014-12-08T15:13:32Z-
dc.date.available2014-12-08T15:13:32Z-
dc.date.issued2007-08-01en_US
dc.identifier.issn0160-5682en_US
dc.identifier.urihttp://dx.doi.org/10.1057/palgrave.jors.2602224en_US
dc.identifier.urihttp://hdl.handle.net/11536/10463-
dc.description.abstractIn most manufacturing industries, tool replacement policy is essential for minimizing the fraction defective and the manufacturing cost. Tool wear is caused by the action of sliding chips in the shear zone, and the friction generated between the tool flank and workpiece. This wear, apparently, is a dominant and irremovable component of variability in many machining processes, which is a systematic assignable cause. As the tool wear occurs in the machining processes, the fraction of defectives would gradually become significant. When the fraction defective reaches a certain level, the tool must be replaced. Therefore, detecting suitable time for tool replacement operation becomes essential. In this paper, we present an analytical approach for unilateral processes based on the one-sided process capability index C-PU (or C-PL) to find the appropriate time for tool replacement. Accurate process capability must be calculated, particularly, when the data contains assignable cause variation. By calculating the index C-PU (or C-PL) in a dynamical environment, we propose estimators of C-PU (or C-PL) and obtain exact form of the sampling distribution in the presence of systematic assignable cause. The proposed procedure is then applied to a real manufacturing process involving tool wear problem, to demonstrate the applicability of the proposed approach.en_US
dc.language.isoen_USen_US
dc.subjectcritical valueen_US
dc.subjecttool replacementen_US
dc.subjectprocess capability indexen_US
dc.subjectproductionen_US
dc.subjectsystematic assignable causeen_US
dc.subjecttool wearen_US
dc.titleTool replacement policy for one-sided processes with low fraction defectiveen_US
dc.typeArticleen_US
dc.identifier.doi10.1057/palgrave.jors.2602224en_US
dc.identifier.journalJOURNAL OF THE OPERATIONAL RESEARCH SOCIETYen_US
dc.citation.volume58en_US
dc.citation.issue8en_US
dc.citation.spage1075en_US
dc.citation.epage1083en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000247790600009-
dc.citation.woscount6-
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