完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen | en_US |
dc.contributor.author | Wei-Zen | en_US |
dc.contributor.author | Huang | en_US |
dc.contributor.author | Guan-Sheng | en_US |
dc.date.accessioned | 2014-12-16T06:14:29Z | - |
dc.date.available | 2014-12-16T06:14:29Z | - |
dc.date.issued | 2009-02-03 | en_US |
dc.identifier.govdoc | H04B003/46 | zh_TW |
dc.identifier.govdoc | H04B017/00 | zh_TW |
dc.identifier.govdoc | H04Q001/20 | zh_TW |
dc.identifier.govdoc | G01R031/28 | zh_TW |
dc.identifier.govdoc | G06F011/00 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/104755 | - |
dc.description.abstract | A bit error rate tester and a pseudo random bit sequences (PRBS) generator thereof are provided. The bit error rate tester includes a transmitter PRBS generator, a master PRBS generator, a slave PRBS generator, a comparator, and a counting unit. The transmitter PRBS generator generates a parallel N-bit (N is an integer larger than 1) original PRBS, wherein an object to be tested receives the original PRBS and outputs a parallel N-bit code to be tested. The master and the slave PRBS generators generate a master and a slave parallel N-bit PRBS, respectively. The comparator receives, compares, and determines whether the code to be tested, the master and the slave PRBS are the same or not, and outputs a comparison result. The counting unit coupling to the comparator counts a number of bit errors based on the comparison result. | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.title | Bit error rate tester and pseudo random bit sequences generator thereof | zh_TW |
dc.type | Patents | en_US |
dc.citation.patentcountry | USA | zh_TW |
dc.citation.patentnumber | 07486725 | zh_TW |
顯示於類別: | 專利資料 |