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dc.contributor.authorHuangen_US
dc.contributor.authorChun-Chengen_US
dc.contributor.authorWuen_US
dc.contributor.authorJieh-Tsorngen_US
dc.date.accessioned2014-12-16T06:14:34Z-
dc.date.available2014-12-16T06:14:34Z-
dc.date.issued2006-06-20en_US
dc.identifier.govdocH03M001/12zh_TW
dc.identifier.govdocH03M001/10zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104811-
dc.description.abstractA background-calibrated comparator and a background-calibrated flash analog-to-digital converter are disclosed for using in mixed-signal integrated circuit design in particular on the high-speed analog-to-digital converter circuit. Without affecting the operation of the comparator, the disclosure is directed at reducing the unpredictable input offset voltage originated from the variation of process parameters and environmental factors. The background-calibrated comparator includes a random chopping comparator, a calibration processor, and a random sequence generator. The background-calibrated flash analog-to-digital converter (ADC) includes a background-calibrated comparator array together with a reference voltage generator, a thermometer code edge detector, and a set of digital encoders.zh_TW
dc.language.isozh_TWen_US
dc.titleBackground comparator offset calibration technique for flash analog-to-digital converterszh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber07064693zh_TW
Appears in Collections:Patents


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