完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChuangen_US
dc.contributor.authorKai-Pingen_US
dc.contributor.authorSheuen_US
dc.contributor.authorLih-Genen_US
dc.contributor.authorTsaien_US
dc.contributor.authorMeng-Changen_US
dc.contributor.authorLaien_US
dc.contributor.authorYinchiehen_US
dc.date.accessioned2014-12-16T06:14:36Z-
dc.date.available2014-12-16T06:14:36Z-
dc.date.issued2005-11-08en_US
dc.identifier.govdocC03B037/018zh_TW
dc.identifier.govdocC03C025/00zh_TW
dc.identifier.govdocG03H001/04zh_TW
dc.identifier.govdocG02B005/30zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104827-
dc.description.abstractThe present invention provides a two-beam interference exposure system that can be simply adjusted by rotating only one mirror. By placing a half-wave plate in one of the interference arms and precisely scanning the relative fiber position, the present invention can expose true apodized fiber Bragg gratings in a single scan by simultaneously rotating the angle of the half-wave plate. By rotationally switching the fast and slow axes of the half-wave plate, the present invention can also expose n-phase-shifted fiber grating by the same system.zh_TW
dc.language.isozh_TWen_US
dc.titleFabrication of true apodized fiber Bragg grating using a new two-beam interferometer with polarization controlzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber06963432zh_TW
顯示於類別:專利資料


文件中的檔案:

  1. 06963432.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。