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dc.contributor.authorLEE Chia-Yuen_US
dc.contributor.authorWANG Chao-Hsunen_US
dc.contributor.authorCHIU Ching-Hsuehen_US
dc.contributor.authorKUO Hao-Chungen_US
dc.date.accessioned2014-12-16T06:14:41Z-
dc.date.available2014-12-16T06:14:41Z-
dc.date.issued2014-12-04en_US
dc.identifier.govdocH01L033/22zh_TW
dc.identifier.govdocH01L033/06zh_TW
dc.identifier.govdocH01L033/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104851-
dc.description.abstractA method for fabricating a lateral-epitaxial-overgrowth thin-film LED with a nanoscale-roughened structure is provided. The lateral-epitaxial-overgrowth thin-film LED with a nanoscale-roughened structure has a substrate, a metal bonding layer formed on the substrate, a first electrode formed on the metal bonding layer, a semiconductor structure formed on the first electrode with a lateral-epitaxial-growth technology, and a second electrode formed on the semiconductor structure. A nanoscale-roughened structure is formed on the semiconductor structure except the region covered by the second electrode. Lateral epitaxial growth is used to effectively inhibit the stacking faults and reduce the thread dislocation density in the semiconductor structure to improve the crystallization quality of the light-emitting layer and reduce leakage current. Meanwhile, the surface roughened structure on the semiconductor structure can promote the external quantum efficiency.zh_TW
dc.language.isozh_TWen_US
dc.titleMETHOD FOR FABRICATING A LATERAL-EPITAXIAL-OVERGROWTH THIN-FILM LIGHT-EMITTING DIODE WITH NANOSCALE-ROUGHENED STRUCTUREzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20140356995zh_TW
Appears in Collections:Patents


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