完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | LEE Chia-Yu | en_US |
dc.contributor.author | WANG Chao-Hsun | en_US |
dc.contributor.author | CHIU Ching-Hsueh | en_US |
dc.contributor.author | KUO Hao-Chung | en_US |
dc.date.accessioned | 2014-12-16T06:14:41Z | - |
dc.date.available | 2014-12-16T06:14:41Z | - |
dc.date.issued | 2014-12-04 | en_US |
dc.identifier.govdoc | H01L033/22 | zh_TW |
dc.identifier.govdoc | H01L033/06 | zh_TW |
dc.identifier.govdoc | H01L033/00 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/104851 | - |
dc.description.abstract | A method for fabricating a lateral-epitaxial-overgrowth thin-film LED with a nanoscale-roughened structure is provided. The lateral-epitaxial-overgrowth thin-film LED with a nanoscale-roughened structure has a substrate, a metal bonding layer formed on the substrate, a first electrode formed on the metal bonding layer, a semiconductor structure formed on the first electrode with a lateral-epitaxial-growth technology, and a second electrode formed on the semiconductor structure. A nanoscale-roughened structure is formed on the semiconductor structure except the region covered by the second electrode. Lateral epitaxial growth is used to effectively inhibit the stacking faults and reduce the thread dislocation density in the semiconductor structure to improve the crystallization quality of the light-emitting layer and reduce leakage current. Meanwhile, the surface roughened structure on the semiconductor structure can promote the external quantum efficiency. | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.title | METHOD FOR FABRICATING A LATERAL-EPITAXIAL-OVERGROWTH THIN-FILM LIGHT-EMITTING DIODE WITH NANOSCALE-ROUGHENED STRUCTURE | zh_TW |
dc.type | Patents | en_US |
dc.citation.patentcountry | USA | zh_TW |
dc.citation.patentnumber | 20140356995 | zh_TW |
顯示於類別: | 專利資料 |