標題: INTELLIGENT ANALYSIS METHOD OF LEAKAGE CURRENT DATA FOR CHIP CLASSIFICATION
作者: WEN Charles Hung-Pin
CHANG Chia-Ling
公開日期: 25-七月-2013
摘要: An intelligent analysis method of leakage current data for chip classification is provided. The analysis method includes steps of: providing a plurality of given patterns to a chip and measuring a plurality of leakage currents of the chip corresponding to the given patterns; finding a minimum value of the leakage currents and deriving an uninfected process parameter according to the minimum value; calculating a plurality of σ-Iddq values based on the uninfected process parameter and the given patterns; and applying a clustering algorithm to the σ-Iddq values to classify whether the chip is a defect-free one. By employing the novel method, it is advantageous of high efficiency and precision without involving any threshold-value determination, visual inspection and/or pattern modification.
官方說明文件#: G01R031/02
G06F019/00
URI: http://hdl.handle.net/11536/105013
專利國: USA
專利號碼: 20130191058
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