標題: | INTELLIGENT ANALYSIS METHOD OF LEAKAGE CURRENT DATA FOR CHIP CLASSIFICATION |
作者: | WEN Charles Hung-Pin CHANG Chia-Ling |
公開日期: | 25-七月-2013 |
摘要: | An intelligent analysis method of leakage current data for chip classification is provided. The analysis method includes steps of: providing a plurality of given patterns to a chip and measuring a plurality of leakage currents of the chip corresponding to the given patterns; finding a minimum value of the leakage currents and deriving an uninfected process parameter according to the minimum value; calculating a plurality of σ-Iddq values based on the uninfected process parameter and the given patterns; and applying a clustering algorithm to the σ-Iddq values to classify whether the chip is a defect-free one. By employing the novel method, it is advantageous of high efficiency and precision without involving any threshold-value determination, visual inspection and/or pattern modification. |
官方說明文件#: | G01R031/02 G06F019/00 |
URI: | http://hdl.handle.net/11536/105013 |
專利國: | USA |
專利號碼: | 20130191058 |
顯示於類別: | 專利資料 |