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dc.contributor.authorChen Chihen_US
dc.contributor.authorLiu Chien-Minen_US
dc.contributor.authorTseng Yuan-Chiehen_US
dc.date.accessioned2014-12-16T06:15:02Z-
dc.date.available2014-12-16T06:15:02Z-
dc.date.issued2013-01-10en_US
dc.identifier.govdocH01L031/0264zh_TW
dc.identifier.govdocH01L031/18zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105089-
dc.description.abstractA photo sensor and a method of fabricating the same are disclosed, the photo sensor of the present invention has ultra-high Schottky junction area per unit volume, and the photo sensor comprises: a first conductive layer; plural metallic nanowires, in which one end of each metallic nanowire connects with the first conductive layer and is covered with a semiconductive layer having a width of 1 nm to 20 nm; and a second conductive layer locating opposite to the first conductive layer, whereby the plural metallic nanowires locate between the first conductive layer and the second conductive layer, and the semiconductive layer contacts with the second conductive layer, wherein the photo sensor of the present invention is used to detect ultra violet (UV) light with a wavelength of 10 nm-400 nm.zh_TW
dc.language.isozh_TWen_US
dc.titlePHOTO SENSOR AND METHOD OF FABRICATING THE SAMEzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20130009143zh_TW
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