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dc.contributor.authorCHEN Chihen_US
dc.contributor.authorChang Yuan-Weien_US
dc.date.accessioned2014-12-16T06:15:05Z-
dc.date.available2014-12-16T06:15:05Z-
dc.date.issued2012-10-25en_US
dc.identifier.govdocG01R027/14zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105126-
dc.description.abstractA structure for measuring bump resistance and a package substrate comprising the same are disclosed, the structure for measuring bump resistance of the present invention comprises: plural connecting bumps arranged in a row; at least one first connecting element; and at least one second connecting element; wherein the nth connecting bump and the (n+1)th connecting bump connect by the first connecting element, the (n+1)th connecting bump and the (n+2)th connecting bump connect by the second connecting element, n is an odd number of 1 or more; the first connecting element connects with a first voltage-measurement pad; the second connecting element connects with an auxiliary pad, the auxiliary pad connects with an auxiliary bump, a second voltage-measurement pad connects with the auxiliary bump.zh_TW
dc.language.isozh_TWen_US
dc.titleSTRUCTURE FOR MEASURING BUMP RESISTANCE AND PACKAGE SUBSTRATE COMPRISING THE SAMEzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20120268147zh_TW
Appears in Collections:Patents


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