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dc.contributor.authorChang, Edward Yien_US
dc.contributor.authorTang, Shih-Hsuanen_US
dc.contributor.authorLin, Yue-Cinen_US
dc.date.accessioned2014-12-16T06:15:35Z-
dc.date.available2014-12-16T06:15:35Z-
dc.date.issued2010-05-27en_US
dc.identifier.govdocH01L021/20zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105406-
dc.description.abstractThe method is disclosed that Si+ is implanted on Si substrate to enhance strain relaxation at the interface between the metamorphic GexSi1−x buffer layers and Si substrate, in order to facilitate the growth of a high quality Ge on Si substrate. And several GexSi1−x buffer layers (Si/Ge0.8Si0.2/Ge0.9Si0.1/Ge) are grown on top of Si substrate by UHVCVD. Then grow pure Ge layer of low dislocation density on GexSi1−x buffer layer. Finally, grow up high efficiency III-V solar cell on GexSi1−x buffer layer.zh_TW
dc.language.isozh_TWen_US
dc.titleMethod for forming a GexSi1-x buffer layer of solar-energy battery on a silicon waferzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20100129956zh_TW
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