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dc.contributor.authorWu, Yew-Chungen_US
dc.contributor.authorLin, Pei-Yenen_US
dc.contributor.authorPeng, Hsien-Chihen_US
dc.date.accessioned2014-12-16T06:16:16Z-
dc.date.available2014-12-16T06:16:16Z-
dc.date.issued2005-08-25en_US
dc.identifier.govdocH01L021/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105734-
dc.description.abstractPresent invention is a method for lifting off GaN pseudomask epitaxy layer using wafer bonding way, wherein GaN epitaxy is obtained by way of selective area growth on a seed and the growth is in a way of pseudomask growth over a substrate. Owing to the different thermal expansion coefficients of the substrate and the GaN seed, by way of annealing and wafer bonding, the GaN epitaxy layer and the epitaxy substrate can be separated, or the GaN epitaxy substrate can be transferred onto another substrate. Thereby, the epitaxy substrate separated is not spoiled during the transferring procedure and can be reused, which lowers the cost; and high-quality GaN epitaxy layer can be transferred to various kinds of substrates for various kinds of usage and for solving the problems of difficulties in the production or the utilization of the substrate (such as difficulties in the cutting, the conductivity, the heat-sinking, and so on.)zh_TW
dc.language.isozh_TWen_US
dc.titleMethod for lifting offGaN pseudomask epitaxy layerusing wafer bonding wayzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20050186764zh_TW
Appears in Collections:Patents


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