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dc.contributor.authorChuang, Kai-Pingen_US
dc.contributor.authorSheu, Lih-Genen_US
dc.contributor.authorTsai, Meng-Changen_US
dc.contributor.authorLai, Yinchiehen_US
dc.date.accessioned2014-12-16T06:16:17Z-
dc.date.available2014-12-16T06:16:17Z-
dc.date.issued2005-07-14en_US
dc.identifier.govdocG02B006/34zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105738-
dc.description.abstractThe present invention provides a two-beam interference exposure system that can be simply adjusted by rotating only one mirror. By placing a half-wave plate in one of the interference arms and precisely scanning the relative fiber position, the present invention can expose true apodized fiber Bragg gratings in a single scan by simultaneously rotating the angle of the half-wave plate. By rotationally switching the fast and slow axes of the half-wave plate, the present invention can also expose n-phase-shifted fiber grating by the same system.zh_TW
dc.language.isozh_TWen_US
dc.titleFabrication of true apodized fiber bragg grating using a new two-beam interferometer with polarization controlzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20050152646zh_TW
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