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DC FieldValueLanguage
dc.contributor.author孟 心飛en_US
dc.contributor.author洪 勝富en_US
dc.contributor.author趙 宇強en_US
dc.date.accessioned2014-12-16T06:16:23Z-
dc.date.available2014-12-16T06:16:23Z-
dc.date.issued2012-02-10en_US
dc.identifier.govdocH01L031/12zh_TW
dc.identifier.govdocH01L031/10zh_TW
dc.identifier.govdocH01L027/146zh_TW
dc.identifier.govdocH01L027/15zh_TW
dc.identifier.govdocH01L051/05zh_TW
dc.identifier.govdocH01L051/50zh_TW
dc.identifier.govdocH05B033/26zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105810-
dc.language.isozh_TWen_US
dc.title光検出装置構造zh_TW
dc.typePatentsen_US
dc.citation.patentcountryJPNzh_TW
dc.citation.patentnumber4922238zh_TW
Appears in Collections:Patents


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