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dc.contributor.author陳三元en_US
dc.contributor.author林晉慶en_US
dc.date.accessioned2014-12-16T06:17:18Z-
dc.date.available2014-12-16T06:17:18Z-
dc.date.issued2005-11-11en_US
dc.identifier.govdocB32B015/04zh_TW
dc.identifier.govdocB32B015/04zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/106356-
dc.description.abstract本發明係為一p型氧化鋅薄膜之製作方法,其為在鍍有氮化矽薄膜的矽基板上,經由磁控射頻濺鍍法,在低溫(50℃)成長氧化鋅薄膜,再經過氮離子佈值處理及熱退火處理,改善其結晶性,並提升本質性紫外光區訊號,降低可見光放射強度,使其具有高電洞濃度、高電洞載子遷移率、高穩定性及光電特性佳等特性,可應用於p-n接面和半導體異質結構的光電元件上。zh_TW
dc.language.isozh_TWen_US
dc.titlep型氧化鋅薄膜之製作方法zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI243096zh_TW
Appears in Collections:Patents


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