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dc.contributor.author郭正次en_US
dc.contributor.author張惠林en_US
dc.contributor.author林兆焄en_US
dc.contributor.author許智明en_US
dc.date.accessioned2014-12-16T06:17:23Z-
dc.date.available2014-12-16T06:17:23Z-
dc.date.issued2005-04-01en_US
dc.identifier.govdocC23C016/22zh_TW
dc.identifier.govdocC23C016/22zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/106398-
dc.description.abstract本發明選擇性沉積碳奈米結構於矽晶基材之方法,依序包含下列步驟:於矽晶基材上決定欲成長碳奈米結構的區域;於欲成長碳奈米結構的區域生長金屬矽化物;於金屬矽化物表面利用化學氣相沉積法成長碳奈米結構。由於在矽晶基材上之金屬矽化物區域即為碳奈米結構成長區域,因而達到選擇性沉積碳奈米結構之目的,另且,該金屬矽化物區域係由半導體製程方法製造,所以本發明的製程方法與現有半導體設備相容性高。zh_TW
dc.language.isozh_TWen_US
dc.title選擇性沉積碳奈米結構於矽晶基材之方法zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI230204zh_TW
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