Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 黃麟倫 | en_US |
| dc.contributor.author | Hwang, Lin-lun | en_US |
| dc.date.accessioned | 2014-12-19T03:51:17Z | - |
| dc.date.available | 2014-12-19T03:51:17Z | - |
| dc.date.issued | 2006 | en_US |
| dc.identifier.issn | 1811-3095 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/107688 | - |
| dc.identifier.uri | https://lawreview.nctu.edu.tw/issues/ | en_US |
| dc.subject | 專利有效性 | zh_TW |
| dc.subject | 舉發 | zh_TW |
| dc.subject | 無效訴訟 | zh_TW |
| dc.subject | 侵權訴訟 | zh_TW |
| dc.subject | 再審查 | zh_TW |
| dc.subject | Patent validity | zh_TW |
| dc.subject | Invalidation action | zh_TW |
| dc.subject | Invalidation litigation | zh_TW |
| dc.subject | Infringement litigation | zh_TW |
| dc.subject | Re-examination | zh_TW |
| dc.title | 專利之有效性與侵害訴訟--以比較法研究為中心 | zh_TW |
| dc.identifier.journal | 科技法學評論 | zh_TW |
| dc.citation.volume | 3 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 169 | en_US |
| dc.citation.epage | 202 | en_US |
| dc.contributor.department | 科技法律研究所 | zh_TW |
| dc.contributor.department | Institute of Technology Law | en_US |
| Appears in Collections: | Technology Law Review | |
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