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dc.contributor.authorLo, Kuang Yaoen_US
dc.contributor.authorHuang, Yi Jenen_US
dc.contributor.authorHuang, Jung Y.en_US
dc.contributor.authorFeng, Zhe Chuanen_US
dc.date.accessioned2014-12-08T15:14:14Z-
dc.date.available2014-12-08T15:14:14Z-
dc.date.issued2007-04-16en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2723671en_US
dc.identifier.urihttp://hdl.handle.net/11536/10895-
dc.description.abstractThe structures of the Zn-O bonding in ZnO (0002) thin films prepared by metal organic chemical vapor deposition have been studied by reflective second harmonic generation (RSHG). The polar Zn-O bond on the top layer is not canceled out and presents 3 mm symmetrical structures on the well-grown ZnO (0002) surface. The average polar strength of the Zn-O bond is correlated with the quality of the ZnO (0002) thin film. The mirror symmetry is caused by the nonvanished polar of twin boundary due to the mismatch between the ZnO film and sapphire substrate and analyzed using s-polarized RSHG with s-polarized fundamental light irradiation. These results demonstrate that the Zn-O heteropolar bonds on the smooth ZnO surface contribute to the SHG intensity. (c) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleReflective second harmonic generation from ZnO thin films: A study on the Zn-O bondingen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2723671en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume90en_US
dc.citation.issue16en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000245870400035-
dc.citation.woscount7-
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