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dc.contributor.authorWu, Pin-Jiunen_US
dc.contributor.authorStetsko, Yuri P.en_US
dc.contributor.authorTsuei, Ku-Dingen_US
dc.contributor.authorDronyak, Romanen_US
dc.contributor.authorLiang, Keng S.en_US
dc.date.accessioned2014-12-08T15:14:15Z-
dc.date.available2014-12-08T15:14:15Z-
dc.date.issued2007-04-16en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2727559en_US
dc.identifier.urihttp://hdl.handle.net/11536/10901-
dc.description.abstractThe structural characteristics of organically passivated CdSe nanocrystals (NCs) were investigated with x-ray diffraction and extended x-ray absorption fine structure. As the NC size decreases, the axial bond length R-(1) for an atomic tetrahedron extends but the equatorial bond length R-(2) contracts, with a similar tendency of distortion for the lattice parameters of the wurtzite structure. The authors suggest that the observed hexagonal distortion is attributed to the surface stress of the NCs related to the organic passivation effect and the relaxation of atomic positions at the stacking fault interface. (c) 2007 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleSize dependence of tetrahedral bond lengths in CdSe nanocrystalsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2727559en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume90en_US
dc.citation.issue16en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000245870400042-
dc.citation.woscount8-
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