標題: | Thickness effects on the electrical characteristics of Ba0.7Sr0.3TiO3 capacitors with nano-Cr interlayer |
作者: | Ho, Chia-Cheng Chiou, Bi-Shiou Chang, Li-Chun 電子工程學系及電子研究所 Innovative Packaging Research Center Department of Electronics Engineering and Institute of Electronics Innovative Packaging Research Center |
公開日期: | 26-三月-2007 |
摘要: | A multilayer Ba0.7Sr0.3TiO3/Cr/Ba0.7Sr0.3TiO3 (BST/Cr/BST) structure was sputtered sequentially onto Pt/Ti/SiO2/Si substrate. With the insertion of a 2 nm Cr interlayer, the temperature coefficient of capacitance of the BST/Cr/BST dielectric is about 69% lower than that of BST monolayer dielectric. The dielectric constant and dissipation factor as the function of Cr thickness are studied. X-ray diffraction patterns, the analysis results of energy dispersive spectroscopy, and the survey scan profiles of Auger electron spectroscopy reveal the formation of a TiO2 secondary phase after the multilayer is annealed at 800 degrees C in O-2 atmosphere. The insertion of nano-Cr interlayer improves the electrical properties of BST capacitors. (c) 2007 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.2717553 http://hdl.handle.net/11536/11005 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.2717553 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 90 |
Issue: | 13 |
結束頁: | |
顯示於類別: | 期刊論文 |