標題: | Growth of single-crystalline RuO2 nanowires with one- and two-nanocontact electrical characterizations |
作者: | Liu, Yee-Lang Wu, Zong-Yi Lin, Kuei-Jiun Huang, Jr-Jeng Chen, Fu-Rong Kai, Ji-Jung Lin, Yong-Han Jian, Wen-Bin Lin, Juhn-Jong 電子物理學系 物理研究所 Department of Electrophysics Institute of Physics |
公開日期: | 1-一月-2007 |
摘要: | Single-crystalline RuO2 nanowires were grown by using a thermal evaporation method. A control of the sizes (width and length) and the length-to-width ratio of the nanowires were achieved by tuning the growth time. A transmission electron microscope-scanning tunneling microscope technique invoking one-nanocontact electrical characterization was adopted to determine the room-temperature resistivity (similar to 100 mu Omega cm) of the nanowires. An e-beam lithography technique facilitating two-nanocontact measurements was performed to establish the metallic characteristic of individual nanowires. The authors found that a nanocontact may introduce high contact resistance, nonlinear current-voltage characteristics, and even semiconducting behavior in the temperature dependent resistance. (c) 2007 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.2428669 http://hdl.handle.net/11536/11247 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.2428669 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 90 |
Issue: | 1 |
結束頁: | |
顯示於類別: | 期刊論文 |