標題: | Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal |
作者: | Chuang, Chun-I Marinova, Vera Lin, Shiuan-Huei Chao, Yu-Faye 電子物理學系 光電工程學系 Department of Electrophysics Department of Photonics |
關鍵字: | Refractive index;Perovskite;Curie region;Ellipsometry |
公開日期: | 28-二月-2011 |
摘要: | Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn(1/3)Nb(2/3))O(3)(PZN)-0.1 PbTiO(3) (PT) during the heating process in real time. Both samples were heated from room temperature to 200 degrees C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.117 is a more favorable medium for the fabrication of optical memories. (C) 2011 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.tsf.2010.12.085 http://hdl.handle.net/11536/1130 |
ISSN: | 0040-6090 |
DOI: | 10.1016/j.tsf.2010.12.085 |
期刊: | THIN SOLID FILMS |
Volume: | 519 |
Issue: | 9 |
起始頁: | 2867 |
結束頁: | 2869 |
顯示於類別: | 會議論文 |