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dc.contributor.authorShu, G. W.en_US
dc.contributor.authorWang, C. K.en_US
dc.contributor.authorWang, J. S.en_US
dc.contributor.authorShen, J. L.en_US
dc.contributor.authorHsiao, R. S.en_US
dc.contributor.authorChou, W. C.en_US
dc.contributor.authorChen, J. F.en_US
dc.contributor.authorLin, T. Y.en_US
dc.contributor.authorKo, C. H.en_US
dc.contributor.authorLai, C. M.en_US
dc.date.accessioned2014-12-08T15:15:13Z-
dc.date.available2014-12-08T15:15:13Z-
dc.date.issued2006-12-14en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0957-4484/17/23/002en_US
dc.identifier.urihttp://hdl.handle.net/11536/11438-
dc.description.abstractThe temperature dependence of the time-resolved photoluminescence (PL) of self-assembled InAs quantum dots (QDs) with InGaAs covering layers was investigated. The PL decay time increases with temperature from 50 to 170 K, and then decreases as the temperature increases further above 170 K. A model based on the phonon-assisted transition between the QD ground state and the continuum state is used to explain the temperature dependence of the PL decay time. This result suggests that the continuum states are important in the carrier capture in self-assembled InAs QDs.en_US
dc.language.isoen_USen_US
dc.titleThe photoluminescence decay time of self-assembled InAs quantum dots covered by InGaAs layersen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0957-4484/17/23/002en_US
dc.identifier.journalNANOTECHNOLOGYen_US
dc.citation.volume17en_US
dc.citation.issue23en_US
dc.citation.spage5722en_US
dc.citation.epage5725en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000242598200002-
dc.citation.woscount5-
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