Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices

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DC Field	Value	Language
dc.contributor.author	Li, Yiming	en_US
dc.contributor.author	Hwang, Chih-Hong	en_US
dc.contributor.author	Huang, Hsuan-Ming	en_US
dc.contributor.author	Yeh, Ta-Ching	en_US
dc.date.accessioned	2014-12-08T15:15:13Z	-
dc.date.available	2014-12-08T15:15:13Z	-
dc.date.issued	2007	en_US
dc.identifier.isbn	978-1-4244-0879-5	en_US
dc.identifier.issn	1078-621X	en_US
dc.identifier.uri	http://hdl.handle.net/11536/11445	-
dc.identifier.uri	http://dx.doi.org/10.1109/IVS.2007.4290101	en_US
dc.language.iso	en_US	en_US
dc.title	Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.doi	10.1109/IVS.2007.4290101	en_US
dc.identifier.journal	2007 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS	en_US
dc.citation.spage	117	en_US
dc.citation.epage	118	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000262360800056	-
Appears in Collections:	Conferences Paper

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