Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices

標題:	Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices
作者:	Li, Yiming Hwang, Chih-Hong Huang, Hsuan-Ming Yeh, Ta-Ching 電信工程研究所 Institute of Communications Engineering
公開日期:	2007
URI:	http://hdl.handle.net/11536/11445 http://dx.doi.org/10.1109/IVS.2007.4290101
ISBN:	978-1-4244-0879-5
ISSN:	1078-621X
DOI:	10.1109/IVS.2007.4290101
期刊:	2007 IEEE INTERNATIONAL SOI CONFERENCE PROCEEDINGS
起始頁:	117
結束頁:	118
Appears in Collections:	Conferences Paper

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