標題: | Influence of Ta content on the physical properties of SrBi2Ta2O9 ferroelectric thin films |
作者: | Hsu, Fan-Yi Leu, Ching-Chich Chien, Chao-Hsin Hu, Chen-Ti 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-Dec-2006 |
摘要: | We have investigated the effect that the Ta content has on the ferroelectric properties of strontium bismuth tantalate (SBT) thin films synthesized using metalorganic decomposition (MOD) and spin coating techniques. The physical properties of these SBT samples were strongly dependent upon the Ta ratio. Polarization measurements revealed that Ta-deficient SBT exhibited a relatively low coercive field (2E(c) similar to 87 kV/cm) and a high remanent polarization (2P(r) similar to 15 mu C/cm(2)). The value of 2P(r) decreased as the Ta ratio in SBT increased. The improved ferroelectric properties of the Ta-deficient SBT,,samples may have resulted from the uniformly well-grown bismuth-layered-structured (BLS) phases of the films and their highly preferential orientation along the a and b axes. We suggest that the. incorporation of Ta vacancies plays an important role in enhancing the crystallinities and microstructures of Ta-deficient SBT films. |
URI: | http://dx.doi.org/10.1557/jmr.2006.0383 http://hdl.handle.net/11536/11511 |
ISSN: | 0884-2914 |
DOI: | 10.1557/jmr.2006.0383 |
期刊: | JOURNAL OF MATERIALS RESEARCH |
Volume: | 21 |
Issue: | 12 |
起始頁: | 3124 |
結束頁: | 3133 |
Appears in Collections: | Articles |
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