標題: Study on fatigue and breakdown properties of Pt/(Pb,Sr)TiO3/Pt capacitors
作者: Wang, Jyh-Liang
Lai, Yi-Sheng
Chiou, Bi-Shiou
Tseng, Huai-Yuan
Tsai, Chun-Chien
Juan, Chuan-Ping
Jan, Chueh-Kuei
Cheng, Huang-Chung
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 22-十一月-2006
摘要: Pulsed- laser deposited ( Pb, Sr) TiO3 ( PSrT) films on Pt/ SiO2/ Si substrate at various ambient oxygen pressures ( P-O2) are investigated in this work. Films deposited at P-O2 below 100 mTorr exhibit the ( 100) preferred orientation and a tetragonal structure with larger tetragonality. In addition, films deposited at 80 mTorr exhibit the most apparent ferroelectric properties in contrast to those deposited at 200 mTorr. Moreover, films deposited at higher P-O2 also exhibit longer lifetimes and higher breakdown fields due to their smaller leakage current density, in terms of the reduction of defects, compensation of oxygen vacancies (OVs), an improved interface and small cluster sizes. An energy band model reveals that fatigue properties of PSrT films are dominated by interfacial states at low P-O2 and by deep trapping states at high P-O2, which could be ascribed to OVs located at the interfaces and inside films, respectively.
URI: http://dx.doi.org/10.1088/0953-8984/18/46/013
http://hdl.handle.net/11536/11531
ISSN: 0953-8984
DOI: 10.1088/0953-8984/18/46/013
期刊: JOURNAL OF PHYSICS-CONDENSED MATTER
Volume: 18
Issue: 46
起始頁: 10457
結束頁: 10467
顯示於類別:期刊論文


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