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dc.contributor.authorLu, K. T.en_US
dc.contributor.authorChen, J. M.en_US
dc.contributor.authorLee, J. M.en_US
dc.contributor.authorHo, S. C.en_US
dc.contributor.authorChang, H. W.en_US
dc.date.accessioned2014-12-08T15:15:26Z-
dc.date.available2014-12-08T15:15:26Z-
dc.date.issued2006-11-01en_US
dc.identifier.issn0969-806Xen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.radphyschem.2006.09.001en_US
dc.identifier.urihttp://hdl.handle.net/11536/11563-
dc.description.abstractState-specific dissociation dynamics for ionic fragments and excited fragments of gaseous SiCl4 following Si 2p core-level excitation have been characterized by the dispersed UV/optical fluorescence spectroscopy and photionization mass spectroscopy. The Si 2p core-to-Rydberg excitation leads to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*, Si+*). In particular, the excited neutral atomic fragments Si* are significantly reinforced. The Si 2p core-to-valence excitation generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation. (c) 2006 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleProduction of neutral fragments of gaseous SiCl4 following Si 2p core-level excitation studied by dispersed fluorescence spectroscopyen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.radphyschem.2006.09.001en_US
dc.identifier.journalRADIATION PHYSICS AND CHEMISTRYen_US
dc.citation.volume75en_US
dc.citation.issue11en_US
dc.citation.spage2058en_US
dc.citation.epage2062en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000242185600121-
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