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dc.contributor.authorChin, Aen_US
dc.contributor.authorChen, WJen_US
dc.date.accessioned2014-12-08T15:02:29Z-
dc.date.available2014-12-08T15:02:29Z-
dc.date.issued1996-07-22en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/11536/1157-
dc.description.abstractWe have studied the growth of InGaAs/GaAs multiple quantum wells (MQWs) on (111)A GaAs. Uniform thickness of (111)A quantum wells is observed by the cross-sectional transmission electron microscopy (TEM). Growth induced long-range In- and Ga-rich InxGa1-xAs/InyGa1-yAs superlattice in (111)A is also observed by cross-sectional TEM in the ternary InGaAs wells. In contrast, none of the above superstructure was observed by TEM on a side-by-side grown (100) oriented substrate. However, the photoluminescence (PL) linewidth is broadened by such compositional modulation. Low-temperature (15 K) photoluminescence showed a broad PL linewidth of 27.5 meV for In0.16Ga0.84As/GaAs MQWs grown on (111)A substrates at 520 degrees C. A decreased PL linewidth of 15.7 meV and a reduced compositional modulation in InGaAs wells can be achieved at a higher growth temperature of 560 degrees C. (C) 1996 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleObservation of compositional modulation in (111)A InGaAs quantum wells and the effect on optical propertiesen_US
dc.typeArticleen_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume69en_US
dc.citation.issue4en_US
dc.citation.spage443en_US
dc.citation.epage445en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996WB36400001-
dc.citation.woscount8-
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