完整后设资料纪录
DC 栏位语言
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorLiu, I-Minen_US
dc.contributor.authorWong, Martin D. F.en_US
dc.date.accessioned2014-12-08T15:15:33Z-
dc.date.available2014-12-08T15:15:33Z-
dc.date.issued2006-11-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2006.873900en_US
dc.identifier.urihttp://hdl.handle.net/11536/11642-
dc.description.abstractInput-output (I/O) placement has always been a concern in modern integrated circuit design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the chip. However, because of I/O placement constraints in design cost (DC) and performance, I/O buffer planning becomes a pressing problem. During the early stages of circuits and package co-design, I/O layout should be evaluated to optimize DC and to avoid product failures. The objective of this brief is to improve the existing/initial standard cell placement by I/O clustering, considering DC reduction and signal integrity preservation. The authors formulate it as a minimum cost flow problem that minimizes alpha W+beta D, where W is the I/O wirelength of the placement and D is the total voltage drop in the power network and, at the same time, reduces the number of I/O buffer blocks. The experimental results on some Microelectronics Center of North Carolina benchmarks show that the author's method averagely achieves better timing performance and over 32% DC reduction when compared with a conventional rule-of-thumb design that is popularly used by circuit designers.en_US
dc.language.isoen_USen_US
dc.subjectchip-package co-designen_US
dc.subjectflip-chip designen_US
dc.subjectinput-output (I/O) planningen_US
dc.subjectsignal integrityen_US
dc.titleI/O clustering in design cost and performance optimization for flip-chip designen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2006.873900en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume25en_US
dc.citation.issue11en_US
dc.citation.spage2552en_US
dc.citation.epage2556en_US
dc.contributor.department电子工程学系及电子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000241567000021-
dc.citation.woscount2-
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