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DC 栏位 | 值 | 语言 |
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dc.contributor.author | Chen, Hung-Ming | en_US |
dc.contributor.author | Liu, I-Min | en_US |
dc.contributor.author | Wong, Martin D. F. | en_US |
dc.date.accessioned | 2014-12-08T15:15:33Z | - |
dc.date.available | 2014-12-08T15:15:33Z | - |
dc.date.issued | 2006-11-01 | en_US |
dc.identifier.issn | 0278-0070 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TCAD.2006.873900 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/11642 | - |
dc.description.abstract | Input-output (I/O) placement has always been a concern in modern integrated circuit design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the chip. However, because of I/O placement constraints in design cost (DC) and performance, I/O buffer planning becomes a pressing problem. During the early stages of circuits and package co-design, I/O layout should be evaluated to optimize DC and to avoid product failures. The objective of this brief is to improve the existing/initial standard cell placement by I/O clustering, considering DC reduction and signal integrity preservation. The authors formulate it as a minimum cost flow problem that minimizes alpha W+beta D, where W is the I/O wirelength of the placement and D is the total voltage drop in the power network and, at the same time, reduces the number of I/O buffer blocks. The experimental results on some Microelectronics Center of North Carolina benchmarks show that the author's method averagely achieves better timing performance and over 32% DC reduction when compared with a conventional rule-of-thumb design that is popularly used by circuit designers. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | chip-package co-design | en_US |
dc.subject | flip-chip design | en_US |
dc.subject | input-output (I/O) planning | en_US |
dc.subject | signal integrity | en_US |
dc.title | I/O clustering in design cost and performance optimization for flip-chip design | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TCAD.2006.873900 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | en_US |
dc.citation.volume | 25 | en_US |
dc.citation.issue | 11 | en_US |
dc.citation.spage | 2552 | en_US |
dc.citation.epage | 2556 | en_US |
dc.contributor.department | 电子工程学系及电子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000241567000021 | - |
dc.citation.woscount | 2 | - |
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