完整後設資料紀錄
DC 欄位語言
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorChang, C. S.en_US
dc.date.accessioned2014-12-08T15:15:41Z-
dc.date.available2014-12-08T15:15:41Z-
dc.date.issued2006-10-01en_US
dc.identifier.issn0268-3768en_US
dc.identifier.urihttp://dx.doi.org/10.1007/s00170-005-0145-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/11719-
dc.description.abstractProcess capability indices C-p, and C-pk have been popularly used in the manufacturing industry for providing measures of process potential and performance. The precision index C-p is used to measure product quality consistency, while the yield index C-pk is used to provide measures of percentage of product conforming to manufacturing specifications. Properties of C-p for processes with a single manufacturing line have been investigated extensively. However, research on properties of C-p for processes with multiple manufacturing lines have been neglected. In this paper, we consider the precision index C-p for processes with three manufacturing lines. We develop a practical procedure for process precision testing to determine whether a process meets the precision requirement preset in the factory. An application example is given.en_US
dc.language.isoen_USen_US
dc.titlePrecision measures for processes with multiple manufacturing linesen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s00170-005-0145-3en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGYen_US
dc.citation.volume30en_US
dc.citation.issue11-12en_US
dc.citation.spage1202en_US
dc.citation.epage1210en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000241219200021-
dc.citation.woscount3-
顯示於類別:期刊論文


文件中的檔案:

  1. 000241219200021.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。