標題: | Study of hole concentration of 1,4-bis[N-(1-naphthyl)-N-'-phenylamino]-4,4(') diamine doped with tungsten oxide by admittance spectroscopy |
作者: | Hsieh, Ming-Ta Chang, Chan-Ching Chen, Jenn-Fang Chen, Chin H. 電子物理學系 電子與資訊研究中心 Department of Electrophysics Microelectronics and Information Systems Research Center |
公開日期: | 4-九月-2006 |
摘要: | The effect of tungsten oxide (WO3) incorporation into 1,4-bis[N-(1-naphthyl)-N-'-phenylamino]-4,4(') diamine (NPB) layer is investigated in NPB-tris(8-hydroxyquinoline)aluminium heterojunction organic light-emitting diodes. The admittance spectroscopy studies show that increasing the WO3 volume percentage from 0% to 16% can increase the hole concentration of the NBP layer from 1.97x10(14) to 1.90x10(17) cm(-3) and decrease the activation energy of the resistance of the NPB layer from 0.354 to 0.176 eV. Thus, this incorporation reduces the Ohmic loss and increases the band bending in the NBP layer near the interface, resulting in an improved hole injection via tunneling through a narrow depletion region. (c) 2006 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.2345610 http://hdl.handle.net/11536/11798 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.2345610 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 89 |
Issue: | 10 |
結束頁: | |
顯示於類別: | 期刊論文 |